Browse "MS-Journal Papers(저널논문)" by Type Article
Showing results 861 to 880 of 7245
| Characterization of highly preferred Pb(Zr,Ti)O3 thin films on La0.5Sr0.5CoO3 and LaNi0.6Co0.4O3 electrodes prepared at low temperature Kim, Il-Doo; Kim, HG, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.40, no.4A, pp.2357 - 2362, 2001-04 |
| Characterization of hydrogen generation for fuel cells via borane hydrolysis using an electroless-deposited Co-P/Ni foam catalyst Eom, Kwang-Sup; Kim, Min-Joong; Kim, Ryoung-Hee; Nam, Do-Hwan; Kwon, Hyuk-Sang, JOURNAL OF POWER SOURCES, v.195, no.9, pp.2830 - 2834, 2010-05 |
| CHARACTERIZATION OF ION-BEAM DEPOSITED REFRACTORY WNX FILMS ON GAAS Lee, JS; Park, Chul Soon; Kang, JY; Ma, DS; Lee, Jeong Yong, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.8, no.5, pp.1117 - 1121, 1990-10 |
| Characterization of low-temperature stress hump in relation to phase formation sequence of nickel silicide Hong, JE; Byun, JS; Kim, SI; Ahn, Byung Tae, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.44, pp.145 - 146, 2005-01 |
| Characterization of Low-Temperature Stress Hump in Relation to Phase Formation Sequence of Nickel Silicide Hong, Jeon Eui; Byun, Jeong Soo; Kim, Sun Il; Ahn, Byung Tae, Japanese Journal of Applied Physics, Vol.44, No.1A, pp.145-146, 2005 |
| Characterization of LSCO/Ir and LSCO/Ru structure as diffusion barrier layers for highly integrated memory devices Kim, Il-Doo; Han, KY; Kim, Ho Gi, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.7, no.2, pp.11 - 14, 2004-02 |
| Characterization of microstructure and defects in epitaxial ZnO (1 1 (2)over-bar 0) films on Al(2)O(3) (1 (1)over-bar 0 2) substrates by transmission electron microscopy Lee, Jae Wook; Han, Seok Kyu; Hong, Soon-Ku; Lee, JeongYong; Yao, Takafumi, JOURNAL OF CRYSTAL GROWTH, v.310, no.18, pp.4102 - 4109, 2008-08 |
| Characterization of microstructure and deformation texture during equal channel Angular pressing of Al-Zn-Mg-Cu alloy Shaeri, M. H.; Salehi, M. T.; Seyyedein, S. H.; Abutalebi, M. R.; Park, Joong Keun, JOURNAL OF ALLOYS AND COMPOUNDS, v.576, pp.350 - 357, 2013-11 |
| Characterization of nano-size YVO4 : Eu and (Y, Gd)VO4 : Eu phosphom by low voltage cathodo- and photoluminescence Kang, JH; Nazarov, M; Bin Im, W; Kim, JY; Jeon, DukYoung, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.23, no.2, pp.843 - 848, 2005-03 |
| Characterization of Nano-Sized Precipitates in a Mn-Based Lean Maraging Steel by Atom Probe Tomography Milian, J.; Ponge, D.; Raabe, D.; Choi, Pyuck-Pa; Dmitrieva, O., STEEL RESEARCH INTERNATIONAL, v.82, no.2, pp.137 - 145, 2011-02 |
| Characterization of Ni-doped BST thin films on LSCO buffer layers prepared by pulsed laser deposition Kim, HS; Lim, MH; Kim, Ho Gi; Kim, Il-Doo, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.7, no.2, pp.1 - 3, 2004-02 |
| Characterization of Ni/Ce Co-doped BST thin film grown on LSCO/Pt electrodes prepared by pulsed laser deposition Kim, HS; Kim, Il-Doo; Lim, MH; Lee, CH; Kim, MS; Kim, HG, INTEGRATED FERROELECTRICS, v.55, no.5, pp.923 - 931, 2003-09 |
| Characterization of Nonvolatile Memory Behaviors of Al/Poly(vinylidene fluoride-trifluoroethylene)/Al2O3/ZnO Thin-Film Transistors Yoon, Sung-Min; Yang, Shin-Hyuk; Byun, Chun-Won; Park, Sang-Hee Ko; Jung, Soon-Won; Cho, Doo-Hee; Kang, Seung-Youl; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.49, no.4, 2010 |
| Characterization of Pb(Zr, Ti)O-3 thin films fabricated by plasma enhanced chemical vapor deposition on Ir-based electrodes Lee, HC; Lee, Won-Jong, JOURNAL OF VACUUM SCIENCE TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.20, no.6, pp.1939 - 1947, 2002-11 |
| CHARACTERIZATION OF PBTIO3 THIN-FILMS DEPOSITED ON PT/TI/SIO2/SI SUBSTRATES BY ECR PECVD CHUNG, SW; SHIN, JS; KIM, JW; No, Kwangsoo; Chun , Soung Soon; Lee, Won-Jong, JOURNAL OF MATERIALS RESEARCH, v.10, no.2, pp.447 - 452, 1995-02 |
| Characterization of pit formation in III-nitrides grown by metalorganic chemical vapor deposition Cho, HK; Lee, JeongYong; Yang, GM, APPLIED PHYSICS LETTERS, v.80, no.8, pp.1370 - 1372, 2002-02 |
| Characterization of Retention Phenomena of Micron-Size Electrical Domains in Pzt Thin Films Hong, Daniel Seungbum; Shin , Hyunjung; Pak , Y. Eugene; No, Kwangsoo, MRS Online Proceedings Library, v.574, 1999-01 |
| Characterization of sensitivity and resolution of silicon resistive probe Kim, Junsoo; Lee, Jaehong; Song, Ickhyun; Lee, Jong Duk; Park, Byung-Gook; Hong, Seungbum; Ko, Hyoungsoo; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.47, no.3, pp.1717 - 1722, 2008-03 |
| Characterization of silicon scanning mirror for laser display Lee, JH; Ko, YC; Choi, BS; Kim, JM; Jeon, DukYoung, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.9, pp.5853 - 5857, 2002-09 |
| CHARACTERIZATION OF SILICON SURFACE CONTAMINATION AND NEAR-SURFACE DAMAGE CAUSED BY C2F6 CHF3 REACTIVE ION ETCHING YUN, SJ; PARK, SJ; PAEK, MC; Lee, JeongYong, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.137, no.8, pp.2634 - 2639, 1990-08 |
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