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Results 1-10 of 11 (Search time: 0.007 seconds).
| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Analysis of Fluorine Effects on Charge-Trap Flash Memory of W/TiN/Al2O3/Si3N4/SiO2/Poly-Si Gate Stack Lee, Tae Yoon; Lee, Seung Hwan; Son, Jun Woo; Lee, Sang Jae; Bong, Jae Hoon; Shin, Eui Joong; Kim, Sung Ho; Hwang, Wan Sik; Moon, Jung Min; Choi, Yang-Kyu; Cho, Byung-Jin, SOLID-STATE ELECTRONICS, v.164, pp.107713, 2020-02 | |
| Mimicry of Excitatory and Inhibitory Artificial Neuron with Leaky Integrate-and-Fire Function by a Single MOSFET Han, Joon-Kyu; Seo, Myungsoo; Kim, Wu-Kang; Kim, Moon-Seok; Kim, Seong-Yeon; Kim, Myung-Su; Yun, Gyeong-Jun; Lee, Geon-Beom; Yu, Ji-Man; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.41, no.2, pp.208 - 211, 2020-02 | |
| A Strategy for Optimizing Low Operating Voltage in a Silicon Biristor Son, Jun-Woo; Hur, Jae; Kim, Wu-Kang; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.19, pp.5 - 10, 2020-01 | |
| Self-Heating Effects in 3-D Vertical-NAND (V-NAND) Flash Memory Yun, Gyeong-Jun; Yun, Dae-Hwan; Park, Jun-Young; Kim, Seong-Yoen; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.12, pp.5505 - 5510, 2020-12 | |
| High-Performance Field-Effect Transistor and Logic Gates Based on GaS-MoS(2 )van der Waals Heterostructure Shin, Gwang Hyuk; Lee, Geon-Beom; An, Eun-Su; Park, Cheolmin; Jin, Hyeok Jun; Lee, Khang June; Oh, Dong-Sik; Kim, Jun-sung; Choi, Yang-Kyu; Choi, Sung-Yool, ACS APPLIED MATERIALS & INTERFACES, v.12, no.4, pp.5106 - 5112, 2020-01 | |
| Low-Frequency Noise Characteristics Under the OFF-State Stress Lee, Geon-Beom; Kim, Choong-Ki; Yoo, Min-Soo; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.10, pp.4366 - 4371, 2020-10 | |
| Triboelectric nanogenerator for a repairable transistor with self-powered electro-thermal annealing Kim, Weon-Guk; Han, Joon-Kyu; Tcho, Il-Woong; Park, Jun-Young; Yu, Ji-Man; Choi, Yang-Kyu, NANO ENERGY, v.76, pp.105000, 2020-10 | |
| A Study of High-Temperature Effects on an Asymmetrically Doped Vertical Pillar-Type Field-Effect Transistor Han, Joon-Kyu; Hur, Jae; Kim, Wu-Kang; Park, Jun-Young; Lee, Seung-Wook; Kim, Seong-Yeon; Yu, Ji-Man; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.19, pp.52 - 55, 2020-01 | |
| Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs Park, Jun-Young; Moon, Dong-Il; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.3, pp.777 - 788, 2020-03 | |
| Analysis of Damage Curing in a MOSFET with Joule Heat Generated by Forward Junction Current at the Source and Drain Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Park, Jun-Young; Choi, Yang-Kyu, MICROELECTRONICS RELIABILITY, v.104, 2020-01 |
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