Browse "School of Electrical Engineering(전기및전자공학부)" by Type Article

Showing results 7401 to 7420 of 14244

7401
Investigation of adjacent channel crosstalk in multichannel monolithically integrated 1.55 mu m photoreceiver arrays

Syao, KC; Yang, Kyounghoon; Zhang, XK; Lu, LH; Katehi, LPB; Bhattacharya, P, JOURNAL OF LIGHTWAVE TECHNOLOGY, v.15, no.10, pp.1888 - 1894, 1997-10

7402
Investigation of Border Trap Characteristics in the AlON/GeO2/Ge Gate Stacks

Seo, Yujin; Kim, Choong-Ki; Lee, Tae-In; Hwang, Wan Sik; Yu, Hyun-Yong; Choi, Yang-Kyu; Cho, Byung Jin, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.10, pp.3998 - 4001, 2017-10

7403
Investigation of electrochemical capacitance of 18k nanoporous current collector incorporated MnO2

Prabhin, V.S.; Jeyasubramanian, K.; Jeyaseeli Rashmi, I.; Hikku, G.S; Veluswamy, Pandiyarasan; Cho, Byung-Jin, MATERIALS CHEMISTRY AND PHYSICS, v.220, pp.128 - 136, 2018-12

7404
Investigation of gate length and fringing field effects for program and erase efficiency in gate-all-around SONOS memory cells

Kim, Moon-Seok; Choi, Sung-Jin; Moon, Dong-Il; Duarte, Juan P.; Kim, Sung-Ho; Choi, Yang-Kyu, SOLID-STATE ELECTRONICS, v.79, pp.7 - 10, 2013-01

7405
Investigation of gate-induced drain leakage (GIDL) current in thin body devices: Single-gate ultra-thin body, symmetrical double-gate, and asymmetrical double-gate MOSFETs

Choi, Yang-Kyu; Ha, D; King, TJ; Bokor, J, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.42, no.4B, pp.2073 - 2076, 2003-04

7406
Investigation of interaction between graphene and dielectrics

Song, Seung Min; Cho, Byung Jin, NANOTECHNOLOGY, v.21, no.33, 2010-08

7407
Investigation of Isolation-Dielectric Effects of PDSOI FinFET on Capacitorless 1T-DRAM

Ryu, Seong-Wan; Han, Jin-Woo; Kim, Chung-Jin; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.56, no.12, pp.3232 - 3235, 2009-12

7408
Investigation of Leaky Characteristic in a Single-Transistor-Based Leaky Integrate-and-Fire Neuron

Han, Joon-Kyu; Kim, Myung-Su; Kim, Seung-Il; Lee, Mun-Woo; Lee, Sang-Won; Yu, Ji-Man; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.11, pp.5912 - 5915, 2021-11

7409
Investigation of link formation in a novel planar-type antifuse structure

Baek, Jong Tae; Park, Hyung-Ho; Kang, Sang-Won; Ahn, Byung Tae; Yoo, Hyung Joun, THIN SOLID FILMS, v.288, no.1-2, pp.41 - 44, 1996-11

7410
Investigation of Low-Frequency Noise in Nonvolatile Memory Composed of a Gate-All-Around Junctionless Nanowire FET

Jeong, Ui-Sik; Kim, Choong-Ki; Bae, Hagyoul; Moon, Dong-Il; Bang, Tewook; Choi, Ji-Min; Hur, Jae; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.5, pp.2210 - 2213, 2016-05

7411
Investigation of multicomponent diffusion in cat brain using a combined MTC-DWI approach

Ronen, I; Moeller, S; Ugurbil, K; Kim, Dae-Shik, MAGNETIC RESONANCE IMAGING, v.24, pp.425 - 431, 2006-05

7412
Investigation of optimal hydrogen sensing performance in semiconducting carbon nanotube network transistors with palladium electrodes

Choi, Bongsik; Lee, Dongil; Ahn, Jae-Hyuk; Yoon, Jinsu; Lee, Juhee; Jeon, Minsu; Kim, Dong Myong; et al, APPLIED PHYSICS LETTERS, v.107, no.19, 2015-11

7413
Investigation of Physically Unclonable Functions Using Flash Memory for Integrated Circuit Authentication

Kim, Moon-Seok; Moon, Dong-Il; Yoo, Sangkyung; Lee, Sang-Han; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.14, no.2, pp.384 - 389, 2015-03

7414
Investigation of quasi-breakdown mechanism through post-quasi-breakdown thermal annealing

Loh, WY; Cho, Byung Jin; Li, MF, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.5A, pp.2873 - 2877, 2002-05

7415
Investigation of reliability degradation of ultra-thin gate oxides irradiated under electron-beam lithography conditions

Chong, PF; Cho, Byung Jin; Chor, EF; Joo, MS; Yeo, IS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.4B, pp.2181 - 2185, 2000-04

7416
Investigation of Self-Heating Effects in Gate-All-Around MOSFETs With Vertically Stacked Multiple Silicon Nanowire Channels

Park, Jun-Young; Lee, Byung-Hyun; Chang, Ki Soo; Kim, Dong Uk; Jeong, Chanbae; Kim, Choong-Ki; Bae, Hagyoul; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.11, pp.4393 - 4399, 2017-11

7417
Investigation of Silicon Nanowire Gate-All-Around Junctionless Transistors Built on a Bulk Substrate

Moon, Dong-Il; Choi, Sung-Jin; Duarte, Juan Pablo; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.60, no.4, pp.1355 - 1360, 2013-04

7418
Investigation of Size Dependence on Sensitivity for Nanowire FET Biosensors

Ahn, Jae-Hyuk; Choi, Sung-Jin; Han, Jin-Woo; Park, Tae-Jung; Lee, Sang-Yup; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.10, no.6, pp.1405 - 1411, 2011-11

7419
Investigation of the Nanoparticle Electrical Contact Lubrication in MEMS Switches

Ko, Seung-Deok; Seo, Min-Ho; Yoon, Yong Hoon; Han, Chang-Hoon; Lim, Keun Seo; Kim, Chang-Keun; Yoon, Jun-Bo, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.26, no.6, pp.1417 - 1427, 2017-12

7420
Investigation of the source-side injection characteristic of a dopant-segregated Schottky barrier metal-oxide-semiconductor field-effect-transistor

Kim, Sung-Ho; Choi, Sung-Jin; Jang, Moon-Gyu; Choi, Yang-Kyu, APPLIED PHYSICS LETTERS, v.95, no.6, 2009-08

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