Investigation of Physically Unclonable Functions Using Flash Memory for Integrated Circuit Authentication

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Flash memory devices are investigated to confirm their application as physically unclonable functions (PUFs). Inherent fluctuations in the characteristics of flash memory devices, even with identical fabrication processes, produce different outputs, which are useful for device fingerprints. A difference in programming/erasing efficiency arises from a widely distributed threshold voltage. However, statistical fluctuations in the threshold voltage represent an advantage for PUF applications. The characteristics of PUFs, such as their unclonability, uncontrollability, unpredictability, and robustness, are investigated using fabricated flash memory devices. A simulation study is performed to support the experimental results and to show that the unpredictability is induced by variations in the gate dielectric thickness.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2015-03
Language
English
Article Type
Article
Keywords

SECURITY; RETENTION; GENERATOR; CELLS

Citation

IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.14, no.2, pp.384 - 389

ISSN
1536-125X
DOI
10.1109/TNANO.2015.2397956
URI
http://hdl.handle.net/10203/202978
Appears in Collection
EE-Journal Papers(저널논문)
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