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Choi, Yang-Kyu (최양규)
교수, School of Electrical Engineering(전기및전자공학부)
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    NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
    Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs

    Park, Jun-Young; Moon, Dong-Il; Lee, Geon-Beom; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.3, pp.777 - 788, 2020-03

    Analysis of Fluorine Effects on Charge-Trap Flash Memory of W/TiN/Al2O3/Si3N4/SiO2/Poly-Si Gate Stack

    Lee, Tae Yoon; Lee, Seung Hwan; Son, Jun Woo; et al, SOLID-STATE ELECTRONICS, v.164, pp.107713, 2020-02

    Mimicry of Excitatory and Inhibitory Artificial Neuron with Leaky Integrate-and-Fire Function by a Single MOSFET

    Han, Joon-Kyu; Seo, Myungsoo; Kim, Wu-Kang; et al, IEEE ELECTRON DEVICE LETTERS, v.41, no.2, pp.208 - 211, 2020-02

    High-Performance Field-Effect Transistor and Logic Gates Based on GaS-MoS(2 )van der Waals Heterostructure

    Shin, Gwang Hyuk; Lee, Geon-Beom; An, Eun-Su; et al, ACS APPLIED MATERIALS & INTERFACES, v.12, no.4, pp.5106 - 5112, 2020-01

    Analysis of Damage Curing in a MOSFET with Joule Heat Generated by Forward Junction Current at the Source and Drain

    Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; et al, MICROELECTRONICS RELIABILITY, v.104, 2020-01

    A Study of High-Temperature Effects on an Asymmetrically Doped Vertical Pillar-Type Field-Effect Transistor

    Han, Joon-Kyu; Hur, Jae; Kim, Wu-Kang; et al, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.19, pp.52 - 55, 2020-01

    Curing of Hot-Carrier Induced Damage by Gate-Induced Drain Leakage Current in Gate-All-Around FETs

    Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyuresearcher, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12

    A Strategy for Optimizing Low Operating Voltage in a Silicon Biristor

    Son, Jun-Woo; Hur, Jae; Kim, Wu-Kang; et al, IEEE Transactions on Nanotechnology, v.19, pp.5 - 10, 2019-12

    Self-powered wearable touchpad composed of all commercial fabrics utilizing a crossline array of triboelectric generators

    Jeon, Seung-Bae; Kim, Weon-Guk; Park, Sang-Jae; et al, NANO ENERGY, v.65, 2019-11

    Effect of Off-state Stress on Gate-Induced Drain Leakage by Interface Traps in Buried-Gate FETs

    Lee, Geon-Beom; Kim, Choong-Ki; Yoo, Min-Soo; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.66, no.12, pp.5126 - 5132, 2019-11

    Joule-Heated and Suspended Silicon Nanowire Based Sensor for Low-Power and Stable Hydrogen Detection

    Yun, Jeonghoon; Ahn, Jae-Hyuk; Moon, Dong-Il; et al, ACS APPLIED MATERIALS & INTERFACES, v.11, no.45, pp.42349 - 42357, 2019-11

    Demonstration of Thermally-Assisted Programming with High Speed and Improved Reliability for Junctionless Nanowire NOR Flash Memory

    Yu, Ji-Man; Park, Jun-Young; Lee, Geon-Beom; et al, IEEE Transactions on Nanotechnology, v.18, pp.1110 - 1113, 2019-10

    A study of the charge distribution and output characteristics of an ultra-thin tribo-dielectric layer

    Kim, Daewon; Kim, Weon-Guk; Jin, Ik Kyeong; et al, NANO ENERGY, v.62, pp.458 - 464, 2019-08

    Bioinspired Polydopamine-Based Resistive-Switching Memory on Cotton Fabric for Wearable Neuromorphic Device Applications

    Bae, Hagyoul; Kim, Daewon; Seo, Myungsoo; et al, ADVANCED MATERIALS TECHNOLOGIES, v.4, no.8, 2019-08

    A Comparative Study of the Curing Effects of Local and Global Thermal Annealing on a FinFET

    Park, Jun-Young; Lee, Geon-Beom; Choi, Yang-Kyuresearcher, IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.7, no.1, pp.954 - 958, 2019-08

    Nanoscale FET-Based Transduction toward Sensitive Extended-Gate Biosensors

    Kwon, Jae; Lee, Byung-Hyun; Kim, Seong-Yeon; et al, ACS SENSORS, v.4, no.6, pp.1724 - 1729, 2019-06

    Suppression of Self-Heating Effects in 3-D V-NAND Flash Memory Using a Plugged Pillar-Shaped Heat Sink

    Park, Jun-Young; Yun, Dae-Hwan; Kim, Seong-Yeon; et al, IEEE ELECTRON DEVICE LETTERS, v.40, no.2, pp.212 - 215, 2019-02

    Electro-Thermal Erasing at 10(4)-Fold Faster Speeds in Charge-Trap Flash Memory

    Kim, Myung-Su; Ahn, Dae-Chul; Park, Jun-Young; et al, IEEE ELECTRON DEVICE LETTERS, v.40, no.2, pp.196 - 199, 2019-02

    Multilevel States of Nano-Electromechanical Switch for a PUF-Based Security Device

    Hwang, Kyu-Man; Kim, Wu-Kang; Jin, Ik Kyeong; et al, SMALL, v.15, no.3, 2019-01

    Power Reduction for Recovery of a FinFET by Electrothermal Annealing

    Han, Joon-Kyu; Park, Jun-Young; Choi, Yang-Kyuresearcher, SOLID-STATE ELECTRONICS, v.151, pp.6 - 10, 2019-01

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