Browse "School of Electrical Engineering(전기및전자공학부)" by Type Article

Showing results 4161 to 4180 of 14285

4161
CRP detection from serum for chip-based point-of-care testing system

Kim, Chang-Hoon; Ahn, Jae-Hyuk; Kim, Jee-Yeon; Choi, Ji-Min; Lim, Kyung-Choon; Park, Tae-Jung; Heo, Nam-Su; et al, BIOSENSORS & BIOELECTRONICS, v.41, pp.322 - 327, 2013-03

4162
Cruise control of automated manual transmission vehicles

Qin, GH; Ge, AL; Zhao, JH; Lee, Ju-Jang, COMPUTING CONTROL ENGINEERING JOURNAL, v.14, no.1, pp.18 - 21, 2003-04

4163
Cryogenic Storage Memory with High-Speed, Low-Power, and Long-Retention Performance

Hur, Jae; Kang, Dongsuk; Moon, Dong-Il; Yu, Jiman; Choi, Yang-Kyu; Shimeng, Yu, ADVANCED ELECTRONIC MATERIALS, v.9, no.6, 2023-06

4164
Cryptographic transistor for true random number generator with low power consumption

Kim, Seung-Il; You, Heong-Jin; Kim, Myung-Su; An, Un-Shi; Kim, Moon-Seok; Lee, Do-Hoon; Ryu, Seung-Tak; et al, Science Advances, v.10, no.8, 2024-02

4165
Cryptographic Triboelectric Random Number Generator with Gentle Breezes of an Entropy Source

Kim, Moon-Seok; Tcho, Il-Woong; Choi, Yang-Kyu, SCIENTIFIC REPORTS, v.14, no.1, 2024-01

4166
Crystalline Phase-Controlled High-Quality Hafnia Ferroelectric With RuO2 Electrode

Goh, Youngin; Cho, Sung Hyun; Park, Sang-Hee Ko; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.8, pp.3431 - 3434, 2020-08

4167
Crystallized HfLaO embedded tetragonal ZrO2 for dynamic random access memory capacitor dielectrics

Shin, Yunsang; Min, Kyung Kyu; Lee, Seok-Hee; Lim, Sung Kyu; Oh, Jae Sub; Lee, Kee-Jeung; Hong, Kwon; et al, APPLIED PHYSICS LETTERS, v.98, no.17, 2011-04

4168
CRYSTALLOGRAPHIC ORIENTATION AND SURFACE-MORPHOLOGY OF CHEMICAL VAPOR-DEPOSITED AL2O3

Park, Chul Soon; Kim, JG; Chun, JS, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.130, no.7, pp.1607 - 1611, 1983-07

4169
Crystallographically defined emitter contact technology for self-alignment process in InP/InGaAs HBTs

Kim, M; Jeon, SK; Kwon, Young Se, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.7, no.8, pp.J29 - J31, 2004

4170
CSMA Using the Bethe Approximation: Scheduling and Utility Maximization

Yun, Se-Young; Shin, Jinwoo; Yi, Yung, IEEE TRANSACTIONS ON INFORMATION THEORY, v.61, no.9, pp.4776 - 4787, 2015-09

4171
CSPR Measurement Method for Optical Single-Sideband Signal

Bo, Tianwai; Kim, Hoon, IEEE PHOTONICS TECHNOLOGY LETTERS, v.31, no.13, pp.1100 - 1103, 2019-07

4172
Cu-based multilayer transparent electrodes: A low-cost alternative to ITO electrodes in organic solar cells

Lim, Sooyeon; Han, Donggeon; Kim, Hoyeon; Lee, Soohyun; Yoo, Seunghyup, SOLAR ENERGY MATERIALS AND SOLAR CELLS, v.101, pp.170 - 175, 2012-06

4173
CUA Loss: Class Uncertainty-Aware Gradient Modulation for Robust Object Detection

Kim, Jung Uk; Kim, Seong Tae; Lee, Hong Joo; Lee, Sangmin; Ro, Yong Man, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY, v.31, no.9, pp.3529 - 3543, 2021-09

4174
Cubic-Structured HfLaO for the Blocking Layer of a Charge-Trap Type Flash Memory Device

Park, Jong-Kyung; Park, Young-Min; Song, Myeong-Ho; Lim, Sung-Kyu; Oh, Jae-Sub; Joo, Moon-Sig; Hong, Kwon; et al, APPLIED PHYSICS EXPRESS, v.3, no.9, 2010-08

4175
Cubic-Structured HfO2 With Optimized Doping of Lanthanum for Higher Dielectric Constant

He, Wei; Zhang, Lu; Chan, Daniel S. H.; Cho, BJ; Zhang, L; Cho, Byung Jin, IEEE ELECTRON DEVICE LETTERS, v.30, no.6, pp.623 - 625, 2009-06

4176
Cultural influences on neural basis of intergroup empathy

Cheon, Bobby K.; Im, Dong-mi; Harada, Tokiko; Kim, Ji-Sook; Mathur, Vani A.; Scimeca, Jason M.; Parrish, Todd B.; et al, NEUROIMAGE, v.57, no.2, pp.642 - 650, 2011-07

4177
Cultural modulation of the neural correlates of emotional pain perception: The role of other-focusedness

Cheon, Bobby K.; Im, Dong-Mi; Harada, Tokiko; Kim, Ji-Sook; Mathur, Vani A.; Scimeca, Jason M.; Parrish, Todd B.; et al, NEUROPSYCHOLOGIA, v.51, no.7, pp.1177 - 1186, 2013-06

4178
Curing of 1-Transistor-DRAM by Joule Heat From Punch-Through Current

Kim, Hyun-Jung; Lee, Geon-Beom; Han, Joon-Kyu; Han, Seong-Joo; Kim, Da-Jin; Yu, Ji-Man; Kim, Myung-Su; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.3, pp.370 - 373, 2022-03

4179
Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs

Park, Jun-Young; Moon, Dong-Il; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.3, pp.777 - 788, 2020-03

4180
Curing of Hot-Carrier Induced Damage by Gate-Induced Drain Leakage Current in Gate-All-Around FETs

Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12

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