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Showing results 42301 to 42320 of 99932

42301
Hot electrons generated by intraband and interband transition detected using a plasmonic Cu/TiO2 nanodiode

Lee, Changhwan; Park, Yujin; Park, Jeong Young, RSC ADVANCES, v.9, no.32, pp.18371 - 18376, 2019-06

42302
Hot embossing for fabrication of a microfluidic 3D cell culture platform

Jeon, Jessie Sungyun; Chung, Seok; Kamm, Roger D.; Charest, Joseph L., BIOMEDICAL MICRODEVICES, v.13, no.2, pp.325 - 333, 2011-04

42303
Hot embossing of polymeric nanostructures using poly(dimethylsiloxane) replica molds based on three-dimensional colloidal crystals

Kim, Mun Ho; Park, OOk, MICROELECTRONIC ENGINEERING, v.91, pp.121 - 126, 2012-03

42304
Hot plasmonic electron-driven catalytic reactions on patterned metal-insulator-metal nanostructures

Kim, Sun Mi; Lee, Changhwan; Goddeti, Kalyan Chakravarthy; Park, Jeong Young, NANOSCALE, v.9, no.32, pp.11667 - 11677, 2017-08

42305
Hot potato in South Korea: The spent nuclear fuel storage dilemma

KANG, Jung Min; Kim, Seoc-Woo; Lee, Byong-Chul, BULLETIN OF THE ATOMIC SCIENTISTS, v.71, no.3, pp.76 - 83, 2015-05

42306
Hot target inspection using a welded fibre acoustic wave piezoelectric sensor and a laser-ultrasonic mirror scanner

Chia, Chen Ciang; Lee, Jung-Ryul; Shin, He-Jin, MEASUREMENT SCIENCE & TECHNOLOGY, v.20, no.12, 2009-12

42307
Hot topics in surface science: Quantum dots for optoelectronic applications (HTSS-QDOA)

Woo, Ju Young; Kim, Whi Dong; Lee, Doh Chang, APPLIED SURFACE SCIENCE ADVANCES, v.5, no.SI, pp.100092, 2021-09

42308
Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFETs with recessed LOCOS isolation structure

Yue, JMP; Chim, WK; Cho, Byung Jin; Chan, DSH; Qin, WH; Kim, YB; Jang, SA; et al, IEEE ELECTRON DEVICE LETTERS, v.21, no.3, pp.130 - 132, 2000-03

42309
Hot-carrier lifetime dependence on channel width and silicon recess depth in N-channel metal-oxide-semiconductor field-effect-transistors with the recessed local oxidation of silicon isolation structure

Chim, WK; Cho, Byung Jin; Yue, JMP, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.1, pp.47 - 53, 2002-01

42310
Hot-electron-based solar energy conversion with metal-semiconductor nanodiodes

Lee, Young Keun; Lee, Hyosun; Lee, Changhwan; Hwang, Euyheon; Park, Jeong Young, JOURNAL OF PHYSICS-CONDENSED MATTER, v.28, no.25, 2016-06

42311
Hot-Electron-Mediated Surface Chemistry: Toward Electronic Control of Catalytic Activity

Park, Jeong Young; Kim, Sun Mi; Lee, Hyosun; Nedrygailov, Ievgen I., ACCOUNTS OF CHEMICAL RESEARCH, v.48, no.8, pp.2475 - 2483, 2015-08

42312
Hot-Wall 및 Cold Wall 工程이 SiO2 熱的窒化膜의 特性에 미치는 影響

이용수; 조범무; 이용현; 손병기, 전자공학회논문지, v.25, no.12, pp.215 - 222, 1992-12

42313
HOT-WIRE MEASUREMENTS OF NEAR WAKES BEHIND AN OSCILLATING AIRFOIL

Park, Seung O; KIM, JS; LEE, BI, AIAA JOURNAL , v.28, no.1, pp.22 - 28, 1990-01

42314
HOT-WIRE, LASER-ANEMOMETER, AND FORCE MEASUREMENTS OF INTERACTING TRAILING VORTICES

IVERSEN, JD; CORSIGLIA, VR; Park, Seung O; BACKHUS, DR; BRICKMAN, RA, JOURNAL OF AIRCRAFT, v.16, no.7, pp.448 - 454, 1979

42315
HOTFUZ: Cost-effective higher-order mutation-based fault localization

Jang, Jong-In; Ryu, Duksan; Baik, Jongmoon, SOFTWARE TESTING VERIFICATION & RELIABILITY, v.32, no.8, 2022-12

42316
Hough 변환을 이용한 입경 측정을 위한 영상처리 알고리즘의 개선

이상용, 한국액체미립화학회지, v.6, no.1, pp.23 - 35, 2001-01

42317
Hourly Solar Irradiance Prediction Based on Support Vector Machine and Its Error Analysis

Bae, Kuk Yeol; Jang, Han Seung; Sung, Dan Keun, IEEE TRANSACTIONS ON POWER SYSTEMS, v.32, no.2, pp.935 - 945, 2017-03

42318
Hourly Solar Irradiance Prediction Based on Support Vector Machine and Its Error Analysis

Bae, Kuk Yeol; Jang, Han Seung; Sung, Dan Keun, IEEE TRANSACTIONS ON POWER SYSTEMS, v.32, no.2, pp.935 - 945, 2017-03

42319
Household Consumption Behavior and Fertility in Korea

K. K. Ro, DEMOGRAPHY, v.12, no.2, 1986

42320
Household lending, interest rates and housing price bubbles in Korea: Regime switching model and Kalman filter approach

Kim, Bong Han; Min, Hong Ghi, ECONOMIC MODELLING, v.28, no.3, pp.1415 - 1423, 2011-05

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