Browse "College of Engineering(공과대학)" by Author Kwon, Yonghwi
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| Accelerating optical proximity correction through deep learning = 딥러닝을 이용한 광학 근접 보정 가속화link Kwon, Yonghwi; Shin, Youngsoo; et al, 한국과학기술원, 2023 |
| Calibration of Compact Resist Model Through CNN Training Kwon, Yonghwi; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.2, pp.180 - 187, 2023-05 |
| Clock gating synthesis of netlist with cyclic logic paths Kwon, Yonghwi; Han, In-Hak; Shin, Youngsoo, 38th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2019, Institute of Electrical and Electronics Engineers Inc., 2019-11-06 |
| Dynamic IR Drop Prediction Using Image-to-Image Translation Neural Network Kwon, Yonghwi; Jung, Giyoon; Hyun, Daijoon; Shin, Youngsoo, IEEE International Symposium on Circuits and Systems (IEEE ISCAS), IEEE, 2021-05 |
| Fast ECO leakage optimization using graph convolutional network Lee, Wonjae; Shin, Youngsoo; Kwon, Yonghwi, 30th Great Lakes Symposium on VLSI, GLSVLSI 2020, pp.187 - 192, Association for Computing Machinery, 2020-09-08 |
| Fast Prediction of Dynamic IR-Drop Using Recurrent U-Net Architecture Kwon, Yonghwi; Shin, Youngsoo, 4th ACM/IEEE Workshop on Machine Learning for CAD, MLCAD 2022, pp.71 - 76, Association for Computing Machinery, Inc, 2022-09-12 |
| Fast prediction of process variation band through machine learning models Kareem, Pervaiz; Kwon, Yonghwi; Cho, Gangmin; Shin, Youngsoo, Conference on Optical Microlithography XXXIV, SPIE, 2021-02-21 |
| Hotspot pattern synthesis using generative network with hotspot probability model Choi, Byeongho; Cho, Gangmin; Kwon, Yonghwi; Shin, Youngsoo, Conference on DTCO and Computational Patterning, SPIE, 2022-04-27 |
| Integrated Test Pattern Extraction and Generation for Accurate Lithography Modeling Cho, Gangmin; Kwon, Yonghwi; Kareem, Pervaiz; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.35, no.3, pp.495 - 503, 2022-08 |
| Layout Pattern Synthesis for Lithography Optimizations Kareem, Pervaiz; Kwon, Yonghwi; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.2, pp.283 - 290, 2020-05 |
| Matrix-OPC with fast MEEF prediction using artificial neural network Kwon, Yonghwi; Shin, Youngsoo, Conference on DTCO and Computational Patterning, SPIE, 2022-04-28 |
| Multisource Clock Tree Synthesis Through Sink Clustering and Fast Clock Latency Prediction Choi, Byungho; Kwon, Yonghwi; Afzaal, Umar; Shin, Youngsoo, 56th IEEE International Symposium on Circuits and Systems, ISCAS 2023, Institute of Electrical and Electronics Engineers Inc., 2023-05-22 |
| Optical proximity correction using bidirectional recurrent neural network (BRNN) Kwon, Yonghwi; Song, Youngsoo; Shin, Youngsoo, Conference on Design-Process-Technology Co-Optimization for Manufacturability XIII, SPIE, 2019-02-27 |
| Optical Proximity Correction Using Bidirectional Recurrent Neural Network With Attention Mechanism Kwon, Yonghwi; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.34, no.2, pp.168 - 176, 2021-05 |
| Optimization of accurate resist kernels through convolutional neural network Kwon, Yonghwi; Shin, Youngsoo, Conference on Optical Microlithography XXXIV, SPIE, 2021-02-21 |
| Pre-layout clock tree estimation and optimization using artificial neural network Koh, Sunwha; Shin, Youngsoo; Kwon, Yonghwi, ACM/IEEE International Symposium on Low Power Electronics and Design, ISLPED 2020, pp.193 - 198, ACM, IEEE, 2020-08-10 |
| Refragmentation through machine learning classifier for fast and accurate optical proximity correction Cho, Gangmin; Kwon, Yonghwi; Taeyoung Kim; Shin, Youngsoo, Conference on DTCO and Computational Patterning, SPIE, 2022-04-28 |
| SRAF printing prediction using artificial neural network Kwon, Yonghwi; Yang, Jinho; Kim, Sungho; Kim, Cheolkyun; Shin, Youngsoo, Conference on Optical Microlithography XXXIII, SPIE, 2020-02-25 |
| Test pattern extraction for lithography modeling under design rule revisions Cho, Gangmin; Kwon, Yonghwi; Kareem, Pervaiz; Kim Sungho; Shin, Youngsoo, Conference on Optical Microlithography XXXIV, SPIE, 2021-02-21 |
| Transient clock power estimation of pre-CTS netlist Kwon, Yonghwi; Jung, Jinwook; Han, In-Hak; Shin, Youngsoo, IEEE International Symposium on Circuits & Systems, Institute of Electrical and Electronics Engineers, 2018-05-27 |
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