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DEEP-REASONING FAULT-DIAGNOSIS - AN AID AND A MODEL

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Yoon, Wan Chulresearcher / HAMMER, JM
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
1988-07
Language
English
Article Type
Article
Citation

IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS, v.18, no.4, pp.659 - 676

ISSN
0018-9472
URI
http://hdl.handle.net/10203/65935
Appears in Collection
IE-Journal Papers(저널논문)
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