DEEP-REASONING FAULT-DIAGNOSIS - AN AID AND A MODEL

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dc.contributor.authorYoon, Wan Chulko
dc.contributor.authorHAMMER, JMko
dc.date.accessioned2013-02-25T23:10:34Z-
dc.date.available2013-02-25T23:10:34Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1988-07-
dc.identifier.citationIEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS, v.18, no.4, pp.659 - 676-
dc.identifier.issn0018-9472-
dc.identifier.urihttp://hdl.handle.net/10203/65935-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleDEEP-REASONING FAULT-DIAGNOSIS - AN AID AND A MODEL-
dc.typeArticle-
dc.identifier.wosidA1988R361400018-
dc.identifier.scopusid2-s2.0-0024035568-
dc.type.rimsART-
dc.citation.volume18-
dc.citation.issue4-
dc.citation.beginningpage659-
dc.citation.endingpage676-
dc.citation.publicationnameIEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS-
dc.contributor.localauthorYoon, Wan Chul-
dc.contributor.nonIdAuthorHAMMER, JM-
dc.type.journalArticleArticle-
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