DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yoon, Wan Chul | ko |
dc.contributor.author | HAMMER, JM | ko |
dc.date.accessioned | 2013-02-25T23:10:34Z | - |
dc.date.available | 2013-02-25T23:10:34Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1988-07 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS, v.18, no.4, pp.659 - 676 | - |
dc.identifier.issn | 0018-9472 | - |
dc.identifier.uri | http://hdl.handle.net/10203/65935 | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | DEEP-REASONING FAULT-DIAGNOSIS - AN AID AND A MODEL | - |
dc.type | Article | - |
dc.identifier.wosid | A1988R361400018 | - |
dc.identifier.scopusid | 2-s2.0-0024035568 | - |
dc.type.rims | ART | - |
dc.citation.volume | 18 | - |
dc.citation.issue | 4 | - |
dc.citation.beginningpage | 659 | - |
dc.citation.endingpage | 676 | - |
dc.citation.publicationname | IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS | - |
dc.contributor.localauthor | Yoon, Wan Chul | - |
dc.contributor.nonIdAuthor | HAMMER, JM | - |
dc.type.journalArticle | Article | - |
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