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Jeon, Chansu; Kang, Sukkyung; Kim, Myeong Eun; Park, Juseong; Kim, Daehee; Kim, Sanha; Kim, Kyung Min, ACS Applied Materials & Interfaces, v.16, no.36, pp.48481 - 48487, 2024-09
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Ippili, Swathi; Kumar, Gobbilla Sai; Sharma, Arti; Ko, Yoonah; Hong, Seungbum; Goddati, Mahendra; Saini, Haneesh; Lee, Jaebeom; Yang, Tae‐Youl; Siddhanta, Soumik; Jella, Venkatraju; Yoon, Soon‐Gil; Jayaramulu, Kolleboyina, Advanced Energy Materials, 2024-08
Jang, Jinhyeong; Joo, Soyun; Yeom, Jiwon; Jo, Yonghan; Zhang, Jingshu; Hong, Seungbum; Park, Chan Beum, ADVANCED SCIENCE, 2024-08
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy Woo, J; Hong, Daniel Seungbum; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsoo, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.19, no.3, pp.818 - 824, 2001 |
Structural and electrical characteristics of highly textured oxidation-free Ru thin films by DC magnetron sputtering Tian, HY; Wang, Y; Chan, HLW; Choy, CL; No, Kwangsoo, JOURNAL OF ALLOYS AND COMPOUNDS, v.392, pp.231 - 236, 2005-04 |
ZrO2 gate dielectrics produced by ultraviolet ozone oxidation for GaN and AlGaN/GaN transistors Dora, Y; Han, S; Klenov, D; Hansen, PJ; No, Kwangsoo; Mishra, UK; Stemmer, S; et al, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.24, pp.575 - 581, 2006-03 |
Surface potential relaxation of ferroelectric domain investigated by Kelvin probe force microscopy Kim, Ji-Yoon; Kim, Yun-Seok; No, Kwang-Soo; Buhlmann, Simon; Hong, Daniel Seungbum; Nam, Yun-Woo; Kim, Seung-Hyun, INTEGRATED FERROELECTRICS, v.85, pp.25 - 30, 2006 |
Grain-Size Dependence of Microcrack Intitiation in Two-Phase Brittle Systems No, Kwangsoo; Hunter, Orville, JOURNAL OF MATERIALS SCIENCE, v.7, no.3, pp.260 - 262, 1988 |
Synthesis and characterization of highly oriented sol-gel (Pb, La)TiO3 thin film optical waveguides Koo, J; No, Kwangsoo; Bae, Byeong-Soo, JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, v.13, no.1-3, pp.869 - 872, 1998 |
Gd-substituted bismuth titanate film capacitors having ferroelectric reliability and large non-volatile charges Chon, U; Jang, HM; Shin, NS; Kim, JS; Ahn, DC; Kim, YS; No, Kwangsoo, PHYSICA B-CONDENSED MATTER, v.388, pp.190 - 194, 2007-01 |
Effect of annealing temperature on the electrical transport properties of CaRuO3-delta thin films directly deposited on the Si substrate Paik, H; Kim, Y; No, Kwangsoo; Cann, DP; Yoon, D; Kim, B, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.204, pp.2339 - 2346, 2007-07 |
A first principles investigation of new cathode materials for advanced lithium batteries Jeon, Young-Ah; Kim, Sung-Kwan; Kim, Yang-Soo; Won, Dae-Hee; Kim, Byung-Il; No, Kwangsoo, JOURNAL OF ELECTROCERAMICS, v.17, no.2-4, pp.667 - 671, 2006-12 |
Grain/domain interaction antd its effect on bit formation in ferroelectric films Kim, Yunseok; Hong, Daniel Seungbum; Park, Hongsik; Kim, Seung-Hyun; Min, Dong-Ki; No, Kwangsoo, INTEGRATED FERROELECTRICS, v.78, pp.255 - 260, 2006 |
Measurement and calculation of optical band gap of chromium aluminum oxide films Kim, E; Jiang, ZT; No, Kwangsoo, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.8, pp.4820 - 4825, 2000-08 |
Dependence of ferroelectricity on film thickness in nano-scale Pb(Zr,Ti)O3 thin films Hong, J.; Song, H.W.; Choi, J.; Kim, S.K.; Kim, Y.; No, Kwangsoo, INTEGRATED FERROELECTRICS, v.68, no.0, pp.157 - 167, 2004 |
The electronic structures for the optical absorption of Hf-O-N thin films Kim, Sung Kwan; Kim, Yang-Soo; Jeon, Young-Ah; Choi, Jongwan; No, Kwangsoo, JOURNAL OF ELECTROCERAMICS, v.17, no.2-4, pp.197 - 203, 2006-12 |
Fabrication and characterization of BaxSr1-xTiO3/YBa(2)Cu3O(x)/SrTiO3 structure Choi, J; Kim, E; Park, SY; Lee, JS; Sung, TH; Park, Y; No, Kwangsoo, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.9, pp.5567 - 5571, 2002-09 |
Metallorganic chemical vapor deposition of metallic Ru thin films on biaxially textured Ni substrates using a Ru(EtCp)(2) precursor Tian, HY; Chan, HLW; Choy, CL; Choi, JW; No, Kwangsoo, MATERIALS CHEMISTRY AND PHYSICS, v.93, pp.142 - 148, 2005-09 |
Determination of piezoelectric coefficients of ferroelectric thin films using GaAs : Cr adaptive interferometer Spirin, VV; Sokolov, IA; No, Kwangsoo, OPTICS AND LASER TECHNOLOGY, v.36, no.4, pp.337 - 340, 2004-06 |
Orientation and fatigue improvement of PZT thin films on cubic textured CaRuO3 electrode Paik, H; Hong, J; Jeon, YA; Kim, SK; Kim, Y; Kim, Y; Kim, YS; et al, INTEGRATED FERROELECTRICS, v.75, pp.115 - 121, 2005 |
Fabrication of PZT thick films on silicon substrates for piezoelectric actuator Jeon, Y; Chung, JS; No, Kwangsoo, JOURNAL OF ELECTROCERAMICS, v.4, no.1, pp.195 - 199, 2000-03 |
Electronic structure simulation of chromium aluminum oxynitride by discrete variational-X alpha method and X-ray photoelectron spectroscopy Choi, YM; Chang, HJ; Do Lee, J; Kim, E; No, Kwangsoo, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.9, pp.5805 - 5808, 2002-09 |
Local structures and electronic structures of Hf-O-N thin films: x-ray absorption fine structure study and first-principles calculations Kim, Sung Kwan; Kim, Yangsoo; No, Kwangsoo, X-RAY SPECTROMETRY, v.35, no.5, pp.287 - 295, 2006-09 |
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