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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Self-Heating Effects in 3-D Vertical-NAND (V-NAND) Flash Memory Yun, Gyeong-Jun; Yun, Dae-Hwan; Park, Jun-Young; Kim, Seong-Yoen; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.12, pp.5505 - 5510, 2020-12 | |
| Triboelectric nanogenerator for a repairable transistor with self-powered electro-thermal annealing Kim, Weon-Guk; Han, Joon-Kyu; Tcho, Il-Woong; Park, Jun-Young; Yu, Ji-Man; Choi, Yang-Kyu, NANO ENERGY, v.76, pp.105000, 2020-10 | |
| A Study of High-Temperature Effects on an Asymmetrically Doped Vertical Pillar-Type Field-Effect Transistor Han, Joon-Kyu; Hur, Jae; Kim, Wu-Kang; Park, Jun-Young; Lee, Seung-Wook; Kim, Seong-Yeon; Yu, Ji-Man; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.19, pp.52 - 55, 2020-01 | |
| Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs Park, Jun-Young; Moon, Dong-Il; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.3, pp.777 - 788, 2020-03 | |
| Analysis of Damage Curing in a MOSFET with Joule Heat Generated by Forward Junction Current at the Source and Drain Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Park, Jun-Young; Choi, Yang-Kyu, MICROELECTRONICS RELIABILITY, v.104, 2020-01 |
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