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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| A Vertical Silicon Nanowire Based Single Transistor Neuron with Excitatory, Inhibitory, and Myelination Functions for Highly Scalable Neuromorphic Hardware Han, Joon-Kyu; Oh, Jungyeop; Yu, Ji-Man; Choi, Sung-Yool; Choi, Yang-Kyu, SMALL, v.17, no.49, 2021-12 | |
| Data Sanitization of SRAM by Thermal Distortion Han, Joon-Kyu; Han, Seong-Joo; Yu, Ji-Man; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.7, pp.3706 - 3710, 2021-07 | |
| A Temperature Sensor With a Thermillator Lee, Mun-Woo; Han, Joon-Kyu; Yun, Gyeong-Jun; Yu, Ji-Man; Lee, Geon-Beom; Han, Seong-Joo; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.42, no.11, pp.1654 - 1657, 2021-09 | |
| Investigation of Leaky Characteristic in a Single-Transistor-Based Leaky Integrate-and-Fire Neuron Han, Joon-Kyu; Kim, Myung-Su; Kim, Seung-Il; Lee, Mun-Woo; Lee, Sang-Won; Yu, Ji-Man; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.11, pp.5912 - 5915, 2021-11 | |
| Tunable and Reconfigurable Logic Gates With Electrolyte-Gated Transistor Array Co-Integrated With Neuromorphic Synapses Yu, Ji-Man; Lee, Chungryeol; Han, Joon-Kyu; Lee, Sang-Won; Kim, Moon-Seok; Im, Sung Gap; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.8, pp.4231 - 4235, 2022-08 | |
| A Multiple-State Ion Synaptic Transistor Applicable to Abnormal Car Detection with Transfer Learning Yu, Ji-Man; Ham, Gyeongdo; Lee, Chungryeol; Lee, Jae-Hyeok; Han, Joon-Kyu; Kim, Jin-Ki; Jang, Donggon; Kim, Nahyun; Kim, Moon-Seok; Im, Sung Gap; Kim, Dae-Shik; Choi, Yang-Kyu, ADVANCED INTELLIGENT SYSTEMS, v.4, no.6, 2022-06 | |
| Mnemonic-Opto-Synaptic Transistor for In-sensor Vision System Han, Joon-Kyu; Chung, Young-Woo; Sim, Jaeho; Yu, Ji-Man; Lee, Geon-Beom; Kim, Sang-Hyeon; Choi, Yang-Kyu, SCIENTIFIC REPORTS, v.12, no.1, 2022-02 | |
| Ultra-fast Data Sanitization of SRAM by Back-biasing to Resist a Cold Boot Attack Han, Seong-Joo; Han, Joon-Kyu; Yun, Gyeong-Jun; Lee, Mun-Woo; Yu, Ji-Man; Choi, Yang-Kyu, SCIENTIFIC REPORTS, v.12, no.1, 2022-01 | |
| Curing of 1-Transistor-DRAM by Joule Heat From Punch-Through Current Kim, Hyun-Jung; Lee, Geon-Beom; Han, Joon-Kyu; Han, Seong-Joo; Kim, Da-Jin; Yu, Ji-Man; Kim, Myung-Su; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.43, no.3, pp.370 - 373, 2022-03 | |
| Reliability Improvement of Gate-All-Around SONOS Memory by Joule Heat From Gate-Induced Drain Leakage Current Lee, Jung-Woo; Han, Joon-Kyu; Yu, Ji-Man; Lee, Geon-Beom; Tcho, Il-Woong; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.1, pp.115 - 119, 2022-01 |
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