Self-Aligned Shallow Junction P+-gate GaAs HEFT for Higher Turn-on and Breakdown Voltages

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Publisher
International Device Research Symposium
Issue Date
1991
Language
ENG
Citation

International Device Research Symposium, pp.331 - 334

URI
http://hdl.handle.net/10203/24940
Appears in Collection
EE-Conference Papers(학술회의논문)
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