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Towards a Formal Framework for Product Line Test Development

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Kang, Sungwonresearcher / Lee, Jihyun / Kim, Myungchulresearcher / Lee, Woojin
Publisher
IEEE
Issue Date
2007-10-16
Language
ENG
Citation

CIT 2007: 7th IEEE International Conference on Computer and Information Technology, pp.921 - 926

URI
http://hdl.handle.net/10203/20445
Appears in Collection
CS-Conference Papers(학술회의논문)

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