DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kang, Sungwon | - |
dc.contributor.author | Lee, Jihyun | - |
dc.contributor.author | Kim, Myungchul | - |
dc.contributor.author | Lee, Woojin | - |
dc.date.accessioned | 2010-11-29T01:30:33Z | - |
dc.date.available | 2010-11-29T01:30:33Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2007-10-16 | - |
dc.identifier.citation | CIT 2007: 7th IEEE International Conference on Computer and Information Technology, v., no., pp.921 - 926 | - |
dc.identifier.uri | http://hdl.handle.net/10203/20445 | - |
dc.description.sponsorship | This work was partially supported by Defense Acquisition Program Administration and Agency for Defense Development under the contract (2007-SW- 14-DM-11). | en |
dc.language | ENG | - |
dc.language.iso | en_US | en |
dc.publisher | IEEE | - |
dc.title | Towards a Formal Framework for Product Line Test Development | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-38049046067 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 921 | - |
dc.citation.endingpage | 926 | - |
dc.citation.publicationname | CIT 2007: 7th IEEE International Conference on Computer and Information Technology | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Kang, Sungwon | - |
dc.contributor.localauthor | Kim, Myungchul | - |
dc.contributor.nonIdAuthor | Lee, Jihyun | - |
dc.contributor.nonIdAuthor | Lee, Woojin | - |
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