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Towards a Formal Framework for Product Line Test Development

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dc.contributor.authorKang, Sungwon-
dc.contributor.authorLee, Jihyun-
dc.contributor.authorKim, Myungchul-
dc.contributor.authorLee, Woojin-
dc.date.accessioned2010-11-29T01:30:33Z-
dc.date.available2010-11-29T01:30:33Z-
dc.date.created2012-02-06-
dc.date.issued2007-10-16-
dc.identifier.citationCIT 2007: 7th IEEE International Conference on Computer and Information Technology, v., no., pp.921 - 926-
dc.identifier.urihttp://hdl.handle.net/10203/20445-
dc.description.sponsorshipThis work was partially supported by Defense Acquisition Program Administration and Agency for Defense Development under the contract (2007-SW- 14-DM-11).en
dc.languageENG-
dc.language.isoen_USen
dc.publisherIEEE-
dc.titleTowards a Formal Framework for Product Line Test Development-
dc.typeConference-
dc.identifier.scopusid2-s2.0-38049046067-
dc.type.rimsCONF-
dc.citation.beginningpage921-
dc.citation.endingpage926-
dc.citation.publicationnameCIT 2007: 7th IEEE International Conference on Computer and Information Technology-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorKang, Sungwon-
dc.contributor.localauthorKim, Myungchul-
dc.contributor.nonIdAuthorLee, Jihyun-
dc.contributor.nonIdAuthorLee, Woojin-
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CS-Conference Papers(학술회의논문)

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