Browse "School of Electrical Engineering(전기및전자공학부)" by Type Article

Showing results 7221 to 7240 of 14299

7221
Indoor Localization Method Based on Sequential Motion Tracking Using Topological Path Map

Lee, Yu-Cheol; Myung, Hyun, IEEE ACCESS, v.7, no.1, 2019-12

7222
Indoor Mobile Robot Localization and Mapping Based on Ambient Magnetic Fields and Aiding Radio Sources

Jung, Jongdae; Lee, Seung Mok; Myung, Hyun, IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.64, no.7, pp.1922 - 1934, 2015-07

7223
Indoor UAV Control Using Multi-Camera Visual Feedback

Oh, Hyondong; Won, Dae-Yeon; Huh, Sung-Sik; Shim, David Hyunchul; Tahk, Min-Jea; Tsourdos, Antonios, JOURNAL OF INTELLIGENT ROBOTIC SYSTEMS, v.61, no.1-4, pp.57 - 84, 2011-03

7224
Inductance Calculations for Plane-Pair Area Fills With Vias in a Power Distribution Network Using a Cavity Model and Partial Inductances

Kim, Jingook; Fan, Jun; Ruehli, Albert E.; Kim, Joungho; Drewniak, James L., IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.59, no.8, pp.1909 - 1924, 2011-08

7225
Induction and control of supramolecular chirality by light in self-assembled helical nanostructures

Kim, Ji Sung; Lee, Jin Hee; Kim, Woo Young; Kim, Hyungjun; Lee, Sanghwa; Lee, Hee-Chul; Lee, Yoon-Sup; et al, NATURE COMMUNICATIONS, v.6, 2015-04

7226
Industrial Grade, Bending-Insensitive, Transparent Nanoforce Touch Sensor via Enhanced Percolation Effect in a Hierarchical Nanocomposite Film

Yoo, Jae-Young; Seo, Min-Ho; Lee, Jae Shin; Choi, Kwang-Wook; Jo, Minseung; Yoon, Jun-Bo, ADVANCED FUNCTIONAL MATERIALS, v.28, no.42, 2018-10

7227
Influence of Fast Charging on Accuracy of Mobility in a-InHfZnO Thin-Film Transistor

Kim, Taeho; Choi, Rino; Jeon, Sanghun, IEEE ELECTRON DEVICE LETTERS, v.38, no.2, pp.203 - 206, 2017-02

7228
Influence of Gold Nanoparticles on the Characteristics of Plasma Display Panels

Kim, Woo-Hyun; Cho, Kwan-Hyun; Choi, Kyung-Cheol; Kim, Do-Youb; Park, O-Ok, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.57, pp.2644 - 2650, 2010-10

7229
Influence of Hf contents on interface state properties in a-HfInZnO thin-film transistors with SiNx/SiOx gate dielectrics

Choi, Hyun-Sik; Jeon, Sanghun; Kim, Hojung; Shin, Jaikwang; Kim, Changjung; Chung, U-In, APPLIED PHYSICS LETTERS, v.99, no.18, 2011-10

7230
Influence of High-Pressure Annealing Conditions on Ferroelectric and Interfacial Properties of Zr-Rich HfxZr1-xO2 Capacitors

Das, Dipjyoti; Buyantogtokh, Batzorig; Gaddam, Venkateswarlu; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.4, pp.1996 - 2002, 2021-04

7231
Influence of High-Pressure Annealing on Memory Properties of Hf0.5Zr0.5O2 Based 1T-FeRAM

Yoon, Jae Seok; Tewari, Amit; Shin, Changhwan; Jeon, Sanghun, IEEE ELECTRON DEVICE LETTERS, v.40, no.7, pp.1076 - 1079, 2019-07

7232
Influence of Nb Doping Concentration on Bolometric Properties of RF Magnetron Sputtered Nb:TiO2-x Films

Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF ELECTRONIC MATERIALS, v.47, no.3, pp.2171 - 2176, 2018-03

7233
Influence of passivation layer on thermal stability of Nb:TiO2-x samples for shutter-less infrared image sensors

Reddy, Y. Ashok Kumar; Ajitha, B.; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, INFRARED PHYSICS & TECHNOLOGY, v.100, pp.52 - 56, 2019-08

7234
Influence of Self-Heating Effect on Interface Trap Generation in Highly Flexible Single-Crystalline Si Nanomembrane Transistors

Bong, Jae Hoon; Kim, Seung-Yoon; Jeong, Chan Bae; Chang, Ki Soo; Hwang, Wan Sik; Cho, Byung Jin, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.19, no.10, pp.6481 - 6486, 2019-10

7235
Influence of the charge trap density distribution in a gate insulator on the positive-bias stress instability of amorphous indium-gallium-zinc oxide thin-film transistors

Kim, Eungtaek; Kim, Choong-Ki; Lee, Myung Keun; Bang, Tewook; Choi, Yang-Kyu; Park, Sang-Hee Ko; Choi, Kyung Cheol, APPLIED PHYSICS LETTERS, v.108, no.18, 2016-05

7236
Influence of the metal phthalocyanine molecular orientation on charge separation at the organic donor/acceptor interface

Lim, Heeseon; Yang, Sena; Lee, Sang-Hoon; Lee, Jung-Yong; Lee, Yeunhee; Situmorang, Andres Bethavan; Kim, Yong-Hyun; et al, JOURNAL OF MATERIALS CHEMISTRY C, v.9, no.6, pp.2156 - 2164, 2021-02

7237
Influence of the Parameters of a Heater Array Inducing a Thermooptic Long-Period Grating on Its Power Consumption

Kwon, Min-Suk; Shin, Sang Yung, JOURNAL OF LIGHTWAVE TECHNOLOGY, v.27, no.9, pp.1108 - 1113, 2009-05

7238
Influence of thermal annealing on the structural and optical properties of polycrystalline Cd0.96Zn0.04Te thin films

Sridharan, MG; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, v.7, pp.1483 - 1491, 2005-06

7239
Influence of TiO2 adhesion layer thickness on properties of (Ba,Sr)TiO3 thin films

Kim, YJ; Lee, YS; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.44, pp.6167 - 6169, 2005-08

7240
Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs

Moon, Joon-Bae; Moon, Dong-Il; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.61, no.3, pp.1420 - 1425, 2014-06

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