Showing results 1 to 26 of 26
A Low-Power Single-Input Level Shifter for Oxide Thin-Film Transistors Kim, Sang Yeon; Kim, Joon Dong; Kim, Yeon Kyung; Lym, Hong Kyun; Kim, Jin Tae; Oh, Hwan Sool; Pi, Jae Eun; et al, JOURNAL OF DISPLAY TECHNOLOGY, v.9, no.2, pp.71 - 73, 2013-02 |
A simple shift register circuit for depletion-mode oxide TFTs Pi, Jae-Eun; Ryu, Min Ki; Hwang, Chi-Sun; Park, Sang-Hee Ko; Yoon, Sung-Min; Lym, HongKyun; Kim, YeonKyung; et al, SOLID-STATE ELECTRONICS, v.79, pp.2 - 6, 2013-01 |
Al-Zn-Sn-O Thin Film Transistors with Top and Bottom Gate Structure for AMOLED Cho, Doo-Hee; Park, Sang-Hee Ko; Byun, Chunwon; Ryu, Min Ki; Yang, Shinhyuk; Hwang, Chi-Sun; Yoon, Sung Min; et al, IEICE TRANSACTIONS ON ELECTRONICS, v.E92C, no.11, pp.1340 - 1346, 2009-11 |
Channel Protection Layer Effect on the Performance of Oxide TFTs Park, Sang-Hee Ko; Cho, Doo-Hee; Yang, Shinhyuk; Ryu, Min Ki; Hwang, Chi-Sun; Yoon, Sung Min; Cheong, Woo-Seok; et al, ETRI JOURNAL, v.31, no.6, pp.653 - 659, 2009-12 |
Effect of the Electrode Materials on the Drain-Bias Stress Instabilities of In-Ga-Zn-O Thin-Film Transistors Bak, Jun Yong; Yang, Sinhyuk; Ryu, Min Ki; Park, Sang Hee Ko; Hwang, Chi Sun; Yoon, Sung Min, ACS APPLIED MATERIALS & INTERFACES, v.4, no.10, pp.5369 - 5374, 2012-10 |
Enhanced bias illumination stability of oxide thin film transistor through insertion of ultrathin positive charge barrier into active material Oh, Himchan; Park, Sang-Hee Ko; Hwang, Chi-Sun; Yang, Shinhyuk; Ryu, Min Ki, APPLIED PHYSICS LETTERS, v.99, no.2, 2011-07 |
High performance thin film transistor with cosputtered amorphous Zn-In-Sn-O channel: Combinatorial approach Ryu, Min Ki; Yang, Shinhyuk; Park, Sang-Hee Ko; Hwang, Chi-Sun; Jeong, Jae Kyeong, APPLIED PHYSICS LETTERS, v.95, no.7, 2009-08 |
High-Performance Al-Sn-Zn-In-O Thin-Film Transistors: Impact of Passivation Layer on Device Stability Yang, Shinhyuk; Cho, Doo-Hee; Ryu, Min Ki; Park, Sang-Hee Ko; Hwang, Chi-Sun; Jang, Jin; Jeong, Jae Kyeong, IEEE ELECTRON DEVICE LETTERS, v.31, no.2, pp.144 - 146, 2010-02 |
Highly Stable, High Mobility Al:SnZnInO Back-Channel Etch Thin-Film Transistor Fabricated Using PAN-Based Wet Etchant for Source and Drain Patterning Cho, Sung Haeng; Ko, Jong Beom; Ryu, Min Ki; Yang, Jong-Heon; Yeom, Hye-In; Lim, Sun Kwon; Hwang, Chi-Sun; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.62, no.11, pp.3653 - 3657, 2015-11 |
Impact of Sn/Zn ratio on the gate bias and temperature-induced instability of Zn-In-Sn-O thin film transistors Ryu, Min Ki; Yang, Shinhyuk; Park, Sang-Hee Ko; Hwang, Chi-Sun; Jeong, Jae Kyeong, APPLIED PHYSICS LETTERS, v.95, no.17, 2009-10 |
Improved Stability of Atomic Layer Deposited ZnO Thin Film Transistor by Intercycle Oxidation Oh, Himchan; Park, Sang-Hee Ko; Ryu, Min Ki; Hwang, Chi-Sun; Yang, Shinhyuk; Kwon, Oh Sang, ETRI JOURNAL, v.34, no.2, pp.280 - 283, 2012-04 |
Improvement in the photon-induced bias stability of Al-Sn-Zn-In-O thin film transistors by adopting AlOx passivation layer Yang, Shinhyuk; Cho, Doo-Hee; Ryu, Min Ki; Park, Sang-Hee Ko; Hwang, Chi-Sun; Jang, Jin; Jeong, Jae Kyeong, APPLIED PHYSICS LETTERS, v.96, no.21, 2010-05 |
Influence of gate dielectric/channel interface engineering on the stability of amorphous indium gallium zinc oxide thin-film transistors Cho, Sung Haeng; Ryu, Min Ki; Kim, Hee-Ok; Kwon, Oh-Sang; Park, Eun-Sook; Roh, Yong-Suk; Hwang, Chi-Sun; et al, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.211, no.9, pp.2126 - 2133, 2014-09 |
Investigation of the Low-Frequency Noise Behavior and Its Correlation with the Subgap Density of States and Bias-Induced Instabilities in Amorphous InGaZnO Thin-Film Transistors with Various Oxygen Flow Rates Jeong, Chan-Yong; Park, Ick-Joon; Cho, In-Tak; Lee, Jong-Ho; Cho, Euo-Sik; Ryu, Min Ki; Park, Sang-Hee Ko; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.51, no.10, 2012-10 |
Low Temperature Fabrication of Aqueous Solution Processed Flexible Indium Oxide Transparent Thin-Film Transistors on a Plastic Substra Bae, Byeong-Soo; Hwang, Young Hwan; Seo, Jin-Suk; Nam, Yun Yong; Ryu, Min Ki; Park, Sang-Hee Ko, 2012 International Meeting on Information Display, IMID, 2012-08 |
Low-Temperature Processed Flexible In-Ga-Zn-O Thin-Film Transistors Exhibiting High Electrical Performance Yang, Shinhyuk; Bak, Jun Yong; Yoon, Sung-Min; Ryu, Min Ki; Oh, Himchan; Hwang, Chi-Sun; Kim, Gi Heon; et al, IEEE ELECTRON DEVICE LETTERS, v.32, no.12, pp.1692 - 1694, 2011-12 |
Novel Aqueous Solution Processed Fluorine-doped Indium Zinc Oxide (F-IZO) Thin-Film Transistors Fabricated at 200℃ Bae, Byeong-Soo; Seo, Jin-Suk; Jeon, Jun-Hyuck; Hwang, Young Hwan; Ryu, Min Ki; Ryu, Sang-Hee Ko, 2012 International Meeting on Information Display, IMID, 2012-08 |
Oxide-Thin-Film-Transistor-Based Ferroelectric Memory Array Kim, Byeong Hoon; Byun, Chun Won; Yoon, Sung-Min; Yang, Shin Hyuk; Jung, Soon-Won; Ryu, Min Ki; Park, Sang-Hee Ko; et al, IEEE ELECTRON DEVICE LETTERS, v.32, no.3, pp.324 - 326, 2011-03 |
Photon-accelerated negative bias instability involving subgap states creation in amorphous In-Ga-Zn-O thin film transistor Oh, Himchan; Yoon, Sung-Min; Ryu, Min Ki; Hwang, Chi-Sun; Yang, Shinhyuk; Park, Sang-Hee Ko, APPLIED PHYSICS LETTERS, v.97, no.18, 2010-11 |
Structural and Optical Properties of Cu Doped ZnO Thin Films by Co-Sputtering Chung, Sung Mook; Shin, Jae-Heon; Lee, Jeong-Min; Ryu, Min Ki; Cheong, Woo-Seok; Park, Sang Hee Ko; Hwang, Chi-Sun; et al, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.11, no.1, pp.782 - 786, 2011-01 |
The role of passivation layer during thermal annealing for oxide semiconductor thin films Hwang, Chi-Sun; Park, Sang-Hee Ko; Cho, Sung-Heang; Ryu, Min Ki; Oh, Himchan; Lee, Su Jae; Yang, Jong-Heon; et al, 12th Symposium on Thin Film Transistor Technologies, TFT 2014 - 2014 ECS and SMEQ Joint International Meeting, pp.115 - 121, Electrochemical Society Inc., 2014-10 |
Transition of dominant instability mechanism depending on negative gate bias under illumination in amorphous In-Ga-Zn-O thin film transistor Oh, Himchan; Yoon, Sung-Min; Ryu, Min Ki; Hwang, Chi-Sun; Yang, Shinhyuk; Park, Sang-Hee Ko, APPLIED PHYSICS LETTERS, v.98, no.3, 2011-01 |
Transparent Al-Zn-Sn-O thin film transistors prepared at low temperature Cho, Doo-Hee; Yang, Shinhyuk; Byun, Chunwon; Shin, Jaeheon; Ryu, Min Ki; Park, Sang-Hee Ko; Hwang, Chi-Sun; et al, APPLIED PHYSICS LETTERS, v.93, no.14, 2008-10 |
Transparent Oxide Thin-Film Transistors Composed of Al and Sn-doped Zinc Indium Oxide Cho, Doo-Hee; Yang, Shinhyuk; Ryu, Min Ki; Park, Sang-Hee Ko; Byun, Chunwon; Yoon, Sung Min; Chu, Hye-Yong; et al, IEEE ELECTRON DEVICE LETTERS, v.30, no.1, pp.48 - 50, 2009-01 |
Trap States of the Oxide Thin Film Transistor Yu, Kyeong Min; Yuh, Jin Tae; Park, Sang Hee Ko; Ryu, Min Ki; Yun, Eui Jung; Bae, Byung Seong, JAPANESE JOURNAL OF APPLIED PHYSICS, v.52, no.10, 2013-10 |
Unusual instability mode of transparent all oxide thin film transistor under dynamic bias condition Oh, Himchan; Hwang, Chi-Sun; Pi, Jae-Eun; Ryu, Min Ki; Park, Sang-Hee Ko; Chu, Hye Yong, APPLIED PHYSICS LETTERS, v.103, no.12, 2013-09 |
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