Al-Zn-Sn-O Thin Film Transistors with Top and Bottom Gate Structure for AMOLED

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We have fabricated the transparent bottom gate and top gate TFTs using new oxide material of Al-Zn-Sn-O (AZTO) as an active layer. The AZTO active layer was deposited by RF magnetron sputtering at room temperature. Our novel TFT showed good TFT performance without post-annealing. The field effect mobility and the sub-threshold swing were improved by the post-annealing, and the mobility increased with SnO2 content. The AZTO TFT (about 4 mol% AlOx, 66 mol% ZnO, and 30 mol% SnO2) exhibited a mobility of 10.3 cm(2)/Vs, a turn-on voltage of 0.4 V. a sub-threshold swing of 0.6 V/dec, and an on/off ratio of 109. Though the bottom gate AZTO TFT showed good electrical performance, the bias stability was relatively poor. The bias stability was significantly improved in the top gate AZTO TFT. We have successfully fabricated the transparent AMOLED panel using the back-plane composed with top gate AZTO TFT array.
Publisher
IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
Issue Date
2009-11
Language
English
Article Type
Article; Proceedings Paper
Keywords

AMORPHOUS OXIDE SEMICONDUCTORS; ROOM-TEMPERATURE; TRANSPORT; TFTS

Citation

IEICE TRANSACTIONS ON ELECTRONICS, v.E92C, no.11, pp.1340 - 1346

ISSN
0916-8524
DOI
10.1587/transele.E92.C.1340
URI
http://hdl.handle.net/10203/201754
Appears in Collection
MS-Journal Papers(저널논문)
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