Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject PB(ZR,TI)O-3

Showing results 1 to 7 of 7

1
Correlation between grain size and domain size distributions in ferroelectric media for probe storage applications

Kim, Y; Cho, Y; Hong, Daniel Seungbum; Buhlmann, S; Park, H; Min, DK; Kim, SH; et al, APPLIED PHYSICS LETTERS, v.89, pp.928 - 936, 2006-10

2
Effect of annealing on fatigue properties of Sb-doped lead zirconate titanate thin films deposited by DC reactive sputtering

Kim, Ho Gi, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.38, no.1A, pp.122 - 126, 1999

3
Electrical properties of Sb-doped PZT films deposited by dc reactive sputtering using multi-targets

Choi, WY; Ahn, JH; Lee, WJ; Kim, Ho-Gi, MATERIALS LETTERS, v.37, no.3, pp.119 - 127, 1998-10

4
Fatigue properties of Sb doped PZT thin films deposited by dc reactive sputtering

Choi, Won-Youl; Ahn, Joon-Hyung; Choi, Jae-Hyoung; Kim, Ho Gi, Integrated Ferroelectrics, v.21, no.1-4, pp.217 - 227, 1998-01

5
Microstructure and electric properties of the PZT thin films fabricated by ECR PECVD: the effects of an interfacial layer and rapid thermal annealing

Chung, Su Ock; Kim, Jae Whan; Kim, Sung Tae; Kim, Geun Hong; Lee, Won-Jong, MATERIALS CHEMISTRY AND PHYSICS, v.53, no.1, pp.60 - 66, 1998

6
Single frequency vertical piezoresponse force microscopy

Hong, Seungbum, JOURNAL OF APPLIED PHYSICS, v.129, no.5, 2021-02

7
Tip traveling and grain boundary effects in domain formation using piezoelectric force microscopy for probe storage applications

Kim, Y; Cho, Y; Hong, Daniel Seungbum; Buhlmann, S; Park, H; Min, DK; Kim, SH; et al, APPLIED PHYSICS LETTERS, v.89, pp.477 - 494, 2006-10

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