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Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject Ge2Sb2Te5

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Showing results 1 to 8 of 8

1
A transmission electron microscopy study on the atomic arrangement and grain growth of hexagonal structured Ge2Sb2Te5

Lee, JeongYong; Kim, YT; Park, YJ, APPLIED SURFACE SCIENCE, v.253, pp.714 - 719, 2006-11

2
Characterization of Ag-x(Ge2Sb2Te5)(1-x) thin film by RF magnetron sputtering

Kim, Dong Hun; Kim, Myung Sun; Kim, Ran-Young; Kim, Kyung Sun; Kim, Ho Gi, MATERIALS CHARACTERIZATION, v.58, no.5, pp.479 - 484, 2007

3
Effect of thermal annealing on microstructural properties of Ti/Ge2Sb2Te5/Ti thin films deposited on SiO2/Si substrates by a sputtering method

Kim, SY; Lee, HS; Chung, IS; Park, YJ; Lee, JeongYong; Kim, TW, APPLIED SURFACE SCIENCE, v.253, no.8, pp.4041 - 4044, 2007-02

4
Effects of annealing conditions on the crystallization and grain growth of metastable Ge2Sb2Te5

Park, YJ; Lee, JeongYong; Youm, MS; Kim, YT, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.44, pp.326 - 327, 2005-01

5
Effects of barrier layers on the electrical behaviors of phase-change memory devices using Sb-rich Ge-Sb-Te films

Yoon, Sung-Min; Choi, Kyu-Jeong; Park, Sang-Hee Ko; Lee, Seung-Yun; Park, Young-Sam; Yu, Byoung-Gon, INTEGRATED FERROELECTRICS, v.93, no.1, pp.75 - 82, 2007

6
In situ transmission electron microscopy study of the nucleation and grain growth of Ge2Sb2Te5 thin films

Park, YJ; Lee, JeongYong; Kim, YT, APPLIED SURFACE SCIENCE, v.252, pp.8102 - 8106, 2006-09

7
Preparation and observation of an artifact-free Ge2Sb2Te5 TEM specimen by the small angle cleavage technique

Kim, MS; Kim, Ho Gi, MATERIALS CHARACTERIZATION, v.56, no.3, pp.245 - 249, 2006-04

8
Pulsed Laser Deposition법으로 증착한 Indium이 도핑 된 $Ge_2Sb_2Te_5$ 박막의 특성평가 = Characterization of indium doped $Ge_2Sb_2Te_5$ thin films by pulsed laser depositionlink

김경선; Kim, Kyoung-Sun; et al, 한국과학기술원, 2006

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