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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Analysis of the effect of digital power ground noise on active balun in UHF RTID SiP

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Park, J. / Ryu, C. / Yoon, C. / Koo, K. / Kim, Jounghoresearcher
Publisher
IEEE
Issue Date
2007-12-12
Language
ENG
Citation

9th Electronics Packaging Technology Conference, EPTC 2007, pp.586 - 590

URI
http://hdl.handle.net/10203/16976
Appears in Collection
EE-Conference Papers(학술회의논문)
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