Analysis of the effect of digital power ground noise on active balun in UHF RTID SiP

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dc.contributor.authorPark, J.-
dc.contributor.authorRyu, C.-
dc.contributor.authorYoon, C.-
dc.contributor.authorKoo, K.-
dc.contributor.authorKim, Joungho-
dc.date.accessioned2010-03-05T06:48:11Z-
dc.date.available2010-03-05T06:48:11Z-
dc.date.created2012-02-06-
dc.date.issued2007-12-12-
dc.identifier.citation9th Electronics Packaging Technology Conference, EPTC 2007, v., no., pp.586 - 590-
dc.identifier.urihttp://hdl.handle.net/10203/16976-
dc.languageENG-
dc.language.isoen_USen
dc.publisherIEEE-
dc.titleAnalysis of the effect of digital power ground noise on active balun in UHF RTID SiP-
dc.typeConference-
dc.identifier.scopusid2-s2.0-50149113992-
dc.type.rimsCONF-
dc.citation.beginningpage586-
dc.citation.endingpage590-
dc.citation.publicationname9th Electronics Packaging Technology Conference, EPTC 2007-
dc.identifier.conferencecountrySingapore-
dc.identifier.conferencecountrySingapore-
dc.contributor.localauthorKim, Joungho-
dc.contributor.nonIdAuthorPark, J.-
dc.contributor.nonIdAuthorRyu, C.-
dc.contributor.nonIdAuthorYoon, C.-
dc.contributor.nonIdAuthorKoo, K.-

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