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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Conference Papers(학술회의논문)

Design and Evaluation of Two Dimensional Metrological Atomic Force Microscope using a Planar Nanoscanner

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Lee, DY / Kim, DM / Gweon, Dae-Gabresearcher
Issue Date
2005-07-08
Language
ENG
Citation

13th International Conference

URI
http://hdl.handle.net/10203/142871
Appears in Collection
ME-Conference Papers(학술회의논문)
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