DSpace at KOASAS: Practical approaches to mitigation of specimen charging in High-Resolution Transmission Electron Microscopy

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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Journal Papers(저널논문)

Practical approaches to mitigation of specimen charging in High-Resolution Transmission Electron Microscopy

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Young-Min Kim / Hu Young Jeong / Seong-Hyeon Hong / Sung-Yoon Chung / Jeong Yong Lee researcher / Youn-Joong Kim

Publisher: Korea Basic Science Institute

Issue Date: 2010-12

Language: Korean

Citation: JOURNAL OF ANALYTICAL SCIENCE & TECHNOLOGY, v.1, no.2, pp.134 - 140

ISSN: 2093-3134

URI: http://hdl.handle.net/10203/94393

Appears in Collection: MS-Journal Papers(저널논문)

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