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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Journal Papers(저널논문)

Practical approaches to mitigation of specimen charging in High-Resolution Transmission Electron Microscopy

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dc.contributor.authorYoung-Min Kimko
dc.contributor.authorHu Young Jeongko
dc.contributor.authorSeong-Hyeon Hongko
dc.contributor.authorSung-Yoon Chungko
dc.contributor.authorJeong Yong Leeko
dc.contributor.authorYoun-Joong Kimko
dc.date.accessioned2013-03-08T21:45:40Z-
dc.date.available2013-03-08T21:45:40Z-
dc.date.created2012-03-16-
dc.date.created2012-03-16-
dc.date.issued2010-12-
dc.identifier.citationJOURNAL OF ANALYTICAL SCIENCE & TECHNOLOGY, v.1, no.2, pp.134 - 140-
dc.identifier.issn2093-3134-
dc.identifier.urihttp://hdl.handle.net/10203/94393-
dc.languageKorean-
dc.publisherKorea Basic Science Institute-
dc.titlePractical approaches to mitigation of specimen charging in High-Resolution Transmission Electron Microscopy-
dc.typeArticle-
dc.type.rimsART-
dc.citation.volume1-
dc.citation.issue2-
dc.citation.beginningpage134-
dc.citation.endingpage140-
dc.citation.publicationnameJOURNAL OF ANALYTICAL SCIENCE & TECHNOLOGY-
dc.contributor.localauthorJeong Yong Lee-
dc.contributor.nonIdAuthorYoung-Min Kim-
dc.contributor.nonIdAuthorHu Young Jeong-
dc.contributor.nonIdAuthorSeong-Hyeon Hong-
dc.contributor.nonIdAuthorSung-Yoon Chung-
dc.contributor.nonIdAuthorYoun-Joong Kim-
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MS-Journal Papers(저널논문)
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