Lattice structural analysis of hydrogen induced defects in SrBi2Nb2O9 thin films

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We have investigated the hydrogen-induced lattice deformation of SrBi2Nb2O9 (SBN) films with high resolution transmission electron microscopy (HR-TEM) and fast Fourier transformation (FFT) analysis. The deformation of the lattice sites is originated from the Bi-oxide layer interface and shifted up and down by 0.92 Angstrom compared with the normal sites in the {115} planes. This distorted perovskite structure results in the hydrogen induced degradation of ferroelectric properties. However, this lattice deformation and the ferroelectric degradation of SBN films are recovered after annealing in oxygen ambient. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Publisher
WILEY-V C H VERLAG GMBH
Issue Date
2004-12
Language
English
Article Type
Article
Keywords

TRANSMISSION ELECTRON-MICROSCOPY; INDUCED DEGRADATION; FERROELECTRIC MEMORIES

Citation

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, v.201, pp.R123 - R126

ISSN
0031-8965
DOI
10.1002/pssa.200409075
URI
http://hdl.handle.net/10203/82899
Appears in Collection
MS-Journal Papers(저널논문)
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