Measurement of thermal conductivities of SiN and TbFeCo films
The effective thermal conductivities of SiN and TbFeCo thin films were measured by comparing the length and width of polarizing microscope image of thermo-magnetically written domains with those of calculated isotherms for the trilayer structure of substrate/Si3N4/Tb22Fe70C08/Si3N4. The resulting data were applied to the quadrillayer structure of substrate/Si3N4/Tb22Fe70C08/Si3N4/Al, and the length of calculated isotherms was turned out to agree with that of written domain.
- Issue Date
- 1996-09
- Language
- English
- Article Type
- Article; Proceedings Paper
- Citation
IEEE TRANSACTIONS ON MAGNETICS, v.32, no.5, pp.4095 - 1
- ISSN
- 0018-9464
- Appears in Collection
- RIMS Journal Papers
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