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Characterization of highly preferred Pb(Zr,Ti)O3 thin films on La0.5Sr0.5CoO3 and LaNi0.6Co0.4O3 electrodes prepared at low temperature Kim, Il-Doo; Kim, HG, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.40, no.4A, pp.2357 - 2362, 2001-04 |
Pb(Zr,Ti)O-3 films fabrication by sol-gel method for piezoelectric actuated device Kim, BJ; Lee, J; Yoo, JB; No, Kwangsoo, FERROELECTRICS, v.232, no.1-4, pp.1127 - 1132, 1999 |
Pneumatic loading method로 측정한 PZT 박막의 압전특성 평가 = Study on the piezoelectric characteristics of PZT thin film measured by pneumatic loading methodlink 변금효; Byon, Kum-Hyo; et al, 한국과학기술원, 2001 |
고집적 FRAM용 LSCO/Ir/TaSiN 하부전극의 안정성에 관한 연구 = Stability of TaSiN diffusion barrier with LSCO/Ir hybrid bottom electrode for FRAM applicationlink 김명선; Kim, Myung-Sun; et al, 한국과학기술원, 2001 |
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