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Practical approaches to mitigation of specimen charging in High-Resolution Transmission Electron Microscopy Young-Min Kim; Hu Young Jeong; Seong-Hyeon Hong; Sung-Yoon Chung; Jeong Yong Lee; Youn-Joong Kim, JOURNAL OF ANALYTICAL SCIENCE & TECHNOLOGY, v.1, no.2, pp.134 - 140, 2010-12 |
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