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Degradation Characteristics of MgO Based Magnetic Tunnel Junction Caused by Surface Roughness of Ta/Ru Buffer Layers Lee, Jung Min; Choi, Chul Min; Sukegawa, Hiroaki; Lee, Jeong Yong; Mitani, Seiji; Song, Yun-Heub, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.16, no.1, pp.654 - 657, 2016-01 |
Temperature dependence of reliability characteristics for magnetic tunnel junctions with a thin MgO dielectric film Choi, Chul-Min; Oh, Young-Taek; Kim, Kyung-Jun; Park, Jin-Suk; Sukegawa, Hiroaki; Mitani, Seiji; Kim, Sung Kyu; et al, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.31, no.7, 2016-07 |
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