Measurement of minority Carrier Diffusion Length of p-type AlGaAs by Scanning Electron Microscope

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Publisher
한국물리학회
Issue Date
1984
Language
Korean
Citation

새물리, v.24, pp.330 - 336

ISSN
0374-4914
URI
http://hdl.handle.net/10203/64320
Appears in Collection
PH-Journal Papers(저널논문)
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