Measurement of minority Carrier Diffusion Length of p-type AlGaAs by Scanning Electron Microscope
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Y. K .Kim | ko |
| dc.contributor.author | S. K .Park | ko |
| dc.contributor.author | C. S. Kim | ko |
| dc.contributor.author | Hae Yong Park | ko |
| dc.date.accessioned | 2013-02-25T18:27:57Z | - |
| dc.date.available | 2013-02-25T18:27:57Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1984 | - |
| dc.identifier.citation | 새물리, v.24, pp.330 - 336 | - |
| dc.identifier.issn | 0374-4914 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/64320 | - |
| dc.language | Korean | - |
| dc.publisher | 한국물리학회 | - |
| dc.title | Measurement of minority Carrier Diffusion Length of p-type AlGaAs by Scanning Electron Microscope | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 24 | - |
| dc.citation.beginningpage | 330 | - |
| dc.citation.endingpage | 336 | - |
| dc.citation.publicationname | 새물리 | - |
| dc.contributor.localauthor | Hae Yong Park | - |
| dc.contributor.nonIdAuthor | Y. K .Kim | - |
| dc.contributor.nonIdAuthor | S. K .Park | - |
| dc.contributor.nonIdAuthor | C. S. Kim | - |
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