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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Evaluation of spectral phase in spectrally resolved white-light interferometry: Comparative study of single-frame techniques Debnath, Sanjit K.; Kothiyal, Mahendra P.; Kim, Seung-Woo, OPTICS AND LASERS IN ENGINEERING, v.47, no.11, pp.1125 - 1130, 2009-11 | |
| Complete 3-D self-calibration of coordinate measuring machines Dang Q.C.; Yoo S.; Kim, Seung-Woo, CIRP ANNALS-MANUFACTURING TECHNOLOGY, v.55, no.1, pp.527 - 530, 2006 | |
| Determination of film thickness and surface profile using reflectometry and spectrally resolved phase shifting interferometry You, Joonho; Debnath, Sanjit Kumar; Kim, Seung-Woo, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.10, no.5, pp.5 - 10, 2009-12 | |
| Volumetric phase-measuring interferometer for three-dimensional coordinate metrology Kim, Seung-Woo; Rhee, H.-G.; Chu, J.-Y., PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, v.27, no.2, pp.205 - 215, 2003 | |
| Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms Park, MC; Kim, Seung-Woo, OPTICAL ENGINEERING, v.39, no.4, pp.952 - 959, 2000-04 |
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