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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Evaluation of spectral phase in spectrally resolved white-light interferometry: Comparative study of single-frame techniques Debnath, Sanjit K.; Kothiyal, Mahendra P.; Kim, Seung-Woo, OPTICS AND LASERS IN ENGINEERING, v.47, no.11, pp.1125 - 1130, 2009-11 | |
| Metrological atomic force microscopy integrated with a modified two-point diffraction interferometer Jin, Jonghan; Rhee, Hyug-Gyo; Kim, Seung-Woo, MEASUREMENT SCIENCE & TECHNOLOGY, v.20, no.10, 2009 | |
| Spectrally resolved white-light interferometry for 3D inspection of a thin-film layer structure Ghim, Young-Sik; Kim, Seung-Woo, APPLIED OPTICS, v.48, no.4, pp.799 - 803, 2009-02 | |
| Vibration-desensitized fiber-diffraction interferometer for industrial surface measurements Park, J.; You, J.; Kim, Seung-Woo, CIRP ANNALS-MANUFACTURING TECHNOLOGY, v.58, no.1, pp.473 - 476, 2009 | |
| Determination of film thickness and surface profile using reflectometry and spectrally resolved phase shifting interferometry You, Joonho; Debnath, Sanjit Kumar; Kim, Seung-Woo, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.10, no.5, pp.5 - 10, 2009-12 | |
| Combs rule Kim, Seung-Woo, NATURE PHOTONICS, v.3, no.6, pp.313 - 314, 2009-06 | |
| Er-doped fiber frequency comb with mHz relative linewidth Kim, Yun-Seok; Kim, Seung-Man; KIM, Young-Jin; Hussein, Hatem; Kim, Seung-Woo, OPTICS EXPRESS, v.17, no.14, pp.11972 - 11977, 2009-07 | |
| All-fiber-based optical frequency generation from an Er-doped fiber femtosecond laser KIM, Young-Jin; Kim, Yun-Seok; Chun, Byung-Jae; Hyun, Sang-Won; Kim, Seung-Woo, OPTICS EXPRESS, v.17, no.13, pp.10939 - 10945, 2009-06 | |
| Absolute length measurement with the frequency comb of a femtosecond laser Hyun, Sang-Won; KIM, Young-Jin; Kim, Yun-Seok; Jin, Jong-Han; Kim, Seung-Woo, MEASUREMENT SCIENCE & TECHNOLOGY, v.20, no.9, 2009-09 | |
| Er-doped fiber comb with enhanced f(ceo) S/N ratio using Tm:Ho-doped fiber Kim, Yun-Seok; KIM, Young-Jin; Kim, Seung-Man; Kim, Seung-Woo, OPTICS EXPRESS, v.17, no.21, pp.18606 - 18611, 2009-10 |
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