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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer Lee, Dong-Yeon; Kim, Dong-Min; Gweon, Dae-Gab; Park, Jinwon, APPLIED SURFACE SCIENCE, v.253, no.8, pp.3945 - 3951, 2007-02 | |
Development of compact high precision linear piezoelectric stepping positioner with nanometer accuracy and large travel range Kang, Dongwoo; Lee, Moon G.; Gweon, Dae-Gab, REVIEW OF SCIENTIFIC INSTRUMENTS, v.78, no.7, pp.561 - 569, 2007-07 |
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