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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Accurate Measurement of the Out-of-plane Motion of a Tip-scanning Atomic Force Microscope Lee, Dong-Yeon; Gweon, Dae-Gab, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.10, no.1, pp.119 - 121, 2009-01 | |
| BEAM SCANNING CONFOCAL DIFFERENTIAL HETERODYNE INTERFEROMETRY Song, Cheol; Kim, Tae Joong; Gweon, Dae-Gab, INTERNATIONAL JOURNAL OF OPTOMECHATRONICS, v.1, no.1, pp.27 - 45, 2007 | |
| Enhancement of fluorescence confocal scanning microscopy lateral resolution by use of structured illumination Kim, Taejoong; Gweon, Dae-Gab; Lee, Jun-Hee, MEASUREMENT SCIENCE TECHNOLOGY, v.20, no.5, 2009-05 | |
| A neural network approach based on interference pattern analysis: Application to an autoalignment method for the focusing unit of NFR system Yoon, HK; Gweon, Dae-Gab; Lee, JH; Jeong, J; Oh, HR, JAPANESE JOURNAL OF APPLIED PHYSICS, v.43, no.7B, pp.4790 - 4794, 2004-07 | |
| Interference Pattern Recognition by the Neural Network for an Alignment automation of the Focusing Unit in NFR system Yoon, Hyoung-Kil; Gweon, Dae-Gab; Lee, Jun-hee; Jeong, Jaehwa; Oh, Hyeong-Ryeol, IEEE TRANSACTIONS ON NEURAL NETWORKS, 2005 | |
| Design and evaluation of two dimensional metrological atomic force microscope using a planar nanoscanner Lee D.-Y.; Kim D.-M.; Gweon, Dae-Gab, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.3B, pp.2124 - 2127, 2006 | |
| Development of dynamic tilt control method and servo algorithm in gap servo NFR Lee, Seong-Hun; Gweon, Dae-Gab, MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, v.15, no.10-11, pp.1675 - 1683, 2009-10 | |
| Method for the improvement of lateral resolution in stimulated emission depletion microscopy using a pupil filter Yoo, Hongki; Song, Incheon; Kim, Taehoon; Gweon, Dae-Gab, MEASUREMENT SCIENCE & TECHNOLOGY, v.18, no.8, pp.N61 - N64, 2007-08 | |
| Measurement and restoration of the point spread function of fluorescence confocal microscopy Yoo, Hongki; Song, Incheon; Gweon, Dae-Gab, JOURNAL OF MICROSCOPY, v.221, no.3, pp.172 - 176, 2006-03 | |
| Measurement of Sub-micrometer Features Based on The Topographic Contrast Using Reflection Confocal Microscopy Lee, SeungWoo; Kang, DongKyun; Yoo, Hongki; Kim, TaeJoong; Gweon, Dae-Gab; Lee, Suk-Won; Kim, Kwang-Soo, Current Optics and Photonics, v.9, no.1, pp.26 - 31, 2005-03 |
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