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Results 1-6 of 6 (Search time: 0.003 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
Three-dimensional surface profile measurement using a beam scanning chromatic confocal microscope

Chun, Byung Seon; Kim, Kwangsoo; Gweon, Dae-Gab, REVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.7, 2009-07

2
Optimal design of high precision XY-scanner with nanometer-level resolution and millimeter-level working range

Kang, Dongwoo; Kim, Kihyun; Kim, Dongmin; Shim, Jongyoup; Gweon, Dae-Gab; Jeong, Jaehwa, MECHATRONICS, v.19, no.4, pp.562 - 570, 2009-06

3
A new magnetic bearing using Halbach magnet arrays for a magnetic levitation stage

Choi, Young-Man; Lee, Moon G.; Gweon, Dae-Gab; Jeong, Jaehwa, REVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.4, 2009

4
Accurate Measurement of the Out-of-plane Motion of a Tip-scanning Atomic Force Microscope

Lee, Dong-Yeon; Gweon, Dae-Gab, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.10, no.1, pp.119 - 121, 2009-01

5
Enhancement of fluorescence confocal scanning microscopy lateral resolution by use of structured illumination

Kim, Taejoong; Gweon, Dae-Gab; Lee, Jun-Hee, MEASUREMENT SCIENCE TECHNOLOGY, v.20, no.5, 2009-05

6
Development of dynamic tilt control method and servo algorithm in gap servo NFR

Lee, Seong-Hun; Gweon, Dae-Gab, MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, v.15, no.10-11, pp.1675 - 1683, 2009-10

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