Browse "ME-Journal Papers(저널논문)" by Author Lee D.-Y.
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| Design and evaluation of two dimensional metrological atomic force microscope using a planar nanoscanner Lee D.-Y.; Kim D.-M.; Gweon, Dae-Gab, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.3B, pp.2124 - 2127, 2006 |
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