Browse "ME-Journal Papers(저널논문)" by Author Kwak, Hyunsoo
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| 785-nm Frequency Comb-Based Time-of-Flight Detection for 3D Surface Profilometry of Silicon Devices Kwak, Hyunsoo; Ahn, Changmin; Na, Yongjin; Bae, Jinho; Kim, Jungwon, IEEE PHOTONICS JOURNAL, v.14, no.5, 2022-10 |
| Massively parallel electro-optic sampling of space-encoded optical pulses for ultrafast multi-dimensional imaging Na, Yongjin; Kwak, Hyunsoo; Ahn, Changmin; Lee, Seung Eon; Lee, Woojin; Kang, Chu-Shik; Lee, Jungchul; et al, LIGHT-SCIENCE & APPLICATIONS, v.12, no.1, 2023-02 |
| Non-destructive thickness characterisation of 3D multilayer semiconductor devices using optical spectral measurements and machine learning Kwak, Hyunsoo; Ryu, Sungyoon; Cho, Suil; Kim, Junmo; Yang, Yusin; Kim, Jungwon, Light: Advanced Manufacturing, v.2, no.1, pp.9 - 19, 2021-01 |
| Semiconductor Multilayer Nanometrology with Machine Learning Kwak, Hyunsoo; Kim, Jungwon, Nanomanufacturing and Metrology, v.6, no.1, 2023-12 |
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