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Results 381-388 of 388 (Search time: 0.006 seconds).
| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Flexible Wearable Device Application by Laser-Induced Graphene Direct Writing on Kevlar Textile Yang, Dongwook; Nam, Han Ku; Le, Truong-Son Dinh; Lee, Younggeun; Kim, Young-Ryeul; Kim, Seung-Woo; KIM, Young-Jin, The 2nd International Conference on Design for 3D Printing, ICD3DP 2023, KSME, NTU 3D Printing singapore center, 2023-10-19 | |
| Laser-Induced-Graphene Formation on Textile for Wearable Devices Yang, Dongwook; Nam, Han Ku; Le, Truong-Son Dinh; Lee, Younggeun; Kim, Young-Ryeul; Kim, Seung-Woo; KIM, Young-Jin, The 9th International Conference on Manufacturing, Machine Design and Tribology, ICMDT 2023, The Korean Society of Mechanical Engineers, The Japan Society of Mechanical Engineers, 2023-03-11 | |
| Silicon Wafer’s Non-destructive Measurement and Interface Inspection System based on Optical Third Harmonic Generation Lee, In Jae; Kim, Dae Hee; Hahm, Jiwon; Yoo, Hongki; Kim, Seung-Woo; KIM, Young-Jin, 1st International Symposium on Micro and Nano Manufacturing, ISMNM 2023, ISMNM, 2023-07-12 | |
| Dynamic Beam Shaping of Ultraviolet Harmonics by Modulating Wavefront of Near-infrared Fundamental Wavelength Won, Seung Jai; Choi, Seungman; Kim, Taewon; Kim, Byunggi; Kim, Seung-Woo; KIM, Young-Jin, The 18th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (IEEE NEMS 2023), IEEE-NEMS(nano/micro engineering molecular system), 2023-05-16 | |
| Silicon Wafer’s Non-destructive Measurement System based on Optical Third Harmonic Generation (THG) Lee, In Jae; Kim, Dae Hee; Hahm, Jiwon; KIM, Young-Jin; Kim, Seung-Woo, The 18th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (IEEE NEMS 2023), IEEE-NEMS(nano/micro engineering molecular system), 2023-05-16 | |
| Optical cavity-referenced ultra-stable terahertz frequency generation Kang, Guseon; Shin, Dong-Chel; Kim, Seung-Woo; KIM, Young-Jin, CLEO®/Europe-EQEC 2023, CLEO, 2023-06-30 | |
| Silicon wafer thickness measurement based on optical third-harmonic generation with femtosecond laser pulses Lee, In Jae; Kim, Dae Hee; Hahm, Ji Won; KIM, Young-Jin; Kim, Seung-Woo, The 12th Advanced Lasers and Photon Sources, ALPS 2023, 2023-04-21 | |
| Oxide thickness profile measurement by dispersive white-light interferometry in CMP process Jeong, Haedo; Park, Boumyoung; Kim, Youngjin; Kim, Hyoungjae; Ghim, Young-Sik; You, Joonho; Kim, Seung-Woo, 2007 International Conference on Planarization/CMP Technology, ICPT 2007, pp.179 - 186, VDE Verlag GmbH, 2007-10 |
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