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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| compensation for phasw change on reflection in white-light scanning interferometry Park, M,C,; Kang, M.G.; Kim, Seung-Woo, SPIE, pp.128 - 135, 2002 | |
| Active thermal stabilization of machine structure using the fixed temperature point of gallium Kim, Seung-Woo, Proc. of 2nd Euspen International Conference, pp.824 - 827, 2001-05-27 | |
| Phase-measuring volumetric interferometer for three-dimensional coordinate metrology Kim, Seung-Woo; Rhee, H.G.; Chu, J.Y., ASPE Annual Meeting, pp.411 - 414, 2002 | |
| Compensation of phase shift upon reflection in white light interferometry Park, M.C.; Kim, Seung-Woo, Proceedings of ASPE 2000 Annual Meeting, pp.505 - 508, 2000 | |
| Phase-shifitng projection moire for out-of-plane displacement measurement Jeong, M.S.; Kim, Seung-Woo, Proceedinfs of SPIE Vol. 4317, pp.170 - 179, 2000 | |
| Precision Length Metrology usting the Optical comb of Femtosecond Pulse Lasers Jin, J; Kim, YJ; Kim, Seung-Woo, nanoengineering symposium 2005, pp.192 - 197, 2005-10-26 | |
| Oblique point-diffraction source for interferometer design Kihm H.; Kim, Seung-Woo, Optical Measurement Systems for Industrial Inspection III, v.5144, pp.240 - 249, 2003-06-23 | |
| Simultaneous Measurement and Compensation of 5-DOF Motion Errors Using Extended Twyman-Green Interferometry Oh, JS; Bae, ED; Kim, Seung-Woo, EUSPEN, pp.314 - 315, 2004-05-06 | |
| Meso-scale 3-D Form Profile Measurements : White-light Scanning Interferometry vs. Moir? Interferometry Kim, Seung-Woo, 2004 ICO International Conference on Optics & Photonics in Technology Frontier, pp.12 - 15, 2004 | |
| Point-Diffraction Interferometer for 3-D Profile Measurement of Rough Surfaces Kim, Seung-Woo; Kim B.-C., Optical Diagnostics for Fluids, Solids, and Combustion II, v.5191, pp.200 - 207, 2003-08-03 |