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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Conference Papers(학술회의논문)

Meso-scale 3-D Form Profile Measurements : White-light Scanning Interferometry vs. Moir? Interferometry

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Kim, Seung-Wooresearcher
Issue Date
2004
Language
ENG
Citation

2004 ICO International Conference on Optics & Photonics in Technology Frontier, pp.12 - 15

URI
http://hdl.handle.net/10203/151108
Appears in Collection
ME-Conference Papers(학술회의논문)
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