Modeling of Edge Threshold Voltage of Mesa-lsolated n-Channel MOSFETs on Fully-Depleted Thin Film SOI

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Publisher
Pergamon-Elsevier Science Ltd
Issue Date
1994-07
Language
English
Article Type
Note
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Citation

SOLID-STATE ELECTRONICS, v.37, no.7, pp.1449 - 1452

ISSN
0038-1101
URI
http://hdl.handle.net/10203/62327
Appears in Collection
RIMS Journal Papers
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