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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Mass spectroscopic study for vaporization characteristics of Ba(TMHD)(2) and Sr(TMHD)(2) in electron cyclotron resonance-plasma enhanced metal organic chemical vapor deposition Lee, JS; Song, HW; Kim, KS; Yu, BG; Jeong, YH; Jiang, ZT; No, Kwangsoo, JOURNAL OF VACUUM SCIENCE TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.15, no.1, pp.72 - 76, 1997 | |
| Effects of gas ring position and mesh introduction on film quality and thickness uniformity Hong, Daniel Seungbum; Kim, E; Jiang, ZT; Bae, Byeong-Soo; No, Kwangsoo; Lim, SC; Woo, S; Koh, Y, MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, v.45, no.1-3, pp.98 - 101, 1997-03 | |
| Application of DV-Xa Cluster Method to the Cr-Al Oxide Mask Materials for Deep UV Lithography Jiang, Zhong-Tao; Yamaguchi, Tomuo; Kim, Eunah; Hong, Seung Bum; No, Kwangsoo; Kang, Young Seog; Park, Soon Ja; Koh, Young Bum, BULLETIN OF THE SOCIETY FOR DISCRETE VARIATIONAL XA, v.10, no.2, pp.22 - 26, 1997-01 | |
| Epitaxial Growth and Optical Properties of Sol-Gel (Pb,La)TiO3 Thin films for Waveguides Koo, Jun Mo; Lee, Chang Ho; No, Kwangsoo; Bae, Byeong-Soo, MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, v.474, pp.61 - 67, 1997 | |
| Effect of the aspect ratio of mica crystals and crystallinity on the microhardness and machinability of mica glass-ceramics Baik, DS; No, Kwangsoo; Chun, JS; Cho, HY, JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, v.67, pp.50 - 54, 1997-05 | |
| Investigation of the drying temperature dependence of the orientation in sol-gel processed PZT thin films Kim, CJ; Yoon, DS; Jiang, ZT; No, Kwangsoo, JOURNAL OF MATERIALS SCIENCE, v.32, no.5, pp.1213 - 1219, 1997-03 | |
| Fluorinated silicon nitride film for the bottom antireflective layer in quarter micron optical lithography Jun, BH; Han, SS; Lee, JS; Kim, YB; Kang, HY; Koh, YB; Bae, Byeong-Soo; No, Kwangsoo, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.12, no.7, pp.921 - 926, 1997-07 | |
| Titanium oxide film for the bottom antireflective layer in deep ultraviolet lithography Jun, BH; Han, SS; Kim, KS; Lee, JS; Jiang, ZT; Bae, Byeong-Soo; No, Kwangsoo; Kim, DW; Kang, HY; Koh, YB, APPLIED OPTICS, v.36, no.7, pp.1482 - 1486, 1997-03 | |
| Electrical properties of a-axis aligned lanthanum-modified lead titanate thin films prepared using sol-gel process Yoon, DS; Kim, CJ; Lee, JS; Choi, CG; Lee, Won-Jong; No, Kwangsoo, METALS AND MATERIALS-KOREA, v.3, no.4, pp.277 - 282, 1997 | |
| On measurement of optical band gap of chromium oxide films containing both amorphous and crystalline phases Hong, Daniel Seungbum; Kim, E; Kim, DW; Sung, TH; No, Kwangsoo, JOURNAL OF NON-CRYSTALLINE SOLIDS, v.221, no.2-3, pp.245 - 254, 1997-12 |
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