Showing results 6401 to 6420 of 7245
The Formation Of The High-Tc Phase In Pb-doped Bi-Sr-Ca-Cu-O System Kim, CJ; Rhee, CK; Lee, HG; Lee, CT; Kang, Suk-Joong L; Won, DY, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.28, no.1, pp.45 - 48, 1989-01 |
THE FORMATION OF TWINNED AUSTENITE IN FE-10CR-10NI-2W MARAGING-STEEL SUK, JI; Hong, Soon-Hyung; Nam, Soo Woo, SCRIPTA METALLURGICA ET MATERIALIA, v.25, no.12, pp.2651 - 2656, 1991-12 |
The Hydration Structure at Yttria-Stabilized Cubic Zirconia (110)-Water Interface with Sub-Angstrom Resolution Hou, Binyang; Kim, Seunghyun; Park, Changyong; Kim, Taeho; Kim, Jongjin; Hong, Daniel Seungbum; Bahn, Chi Bum; et al, SCIENTIFIC REPORTS, v.6, 2016-06 |
The In compositional gradation effect on photoluminescence in InGaN/GaN multi-quantum-well structures Kim, Keun-Joo; Kim, Chung-Soo; Lee, Jeong-Yong, JOURNAL OF PHYSICS-CONDENSED MATTER, v.18, pp.3127 - 3140, 2006-03 |
The In-Situ TEM Isothermal Aging Evolution in a μ-Cu/NiAu/Sn/Cu Solder Joint for Full Intermetallic Compounds Interconnects of Flexible Electronics Liu, Jinhong; Jing, Xinyi; Chen, Jieshi; Paik, Kyung-Wook; He, Peng; Zhang, Shuye, ELECTRONIC MATERIALS LETTERS, v.20, no.3, pp.352 - 361, 2024-05 |
The influence of an extrinsic interfacial layer on the polarization of sputtered BaTiO3 film Cho, YW; Choi, Si-Kyung; Rao, GV, APPLIED PHYSICS LETTERS, v.86, no.20, pp.40 - +, 2005-05 |
The Influence of Atomic Bombardment on ZnO Thin Films Prepared by an RF Planar Magnetron B.M. Han; S.Y. Kim; J.H. Jo; S. Chang; J.H. Choi; J.Y. Lee, 응용물리, v.9, no.1, pp.33 - 40, 1996-12 |
The Influence of Capping Layers on Tunneling Magnetoresistance and Microstructure in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions upon Annealing Kim, Geunwoo; Lee, Soogil; Lee, Sanghwa; Song, Byonggwon; Lee, Byung-Kyu; Lee, Duhyun; Lee, Jin Seo; et al, NANOMATERIALS, v.13, no.18, 2023-09 |
The Influence of Hydrogen on Defects of In-Ga-Zn-O Semiconductor Thin-Film Transistors With Atomic-Layer Deposition of Al2O3 Kim, Taeho; Nam, Yunyong; Hur, Jihyun; Park, Sang-Hee Ko; Jeon, Sanghun, IEEE ELECTRON DEVICE LETTERS, v.37, no.9, pp.1131 - 1134, 2016-09 |
The influence of Mn and Cr on the tensile properties of A356-0.2OFe alloy Kim, HY; Han, SW; Lee, HyuckMo, MATERIALS LETTERS, v.60, no.15, pp.1880 - 1883, 2006-07 |
The influences of microstructure and nitrogen alloying on pitting corrosion of type 316L and 20 wt.% Mn-substituted type 316L stainless steels Lim, YS; Kim, JS; Ahn, SJ; Kwon, Hyuk-Sang; Katada, Y, CORROSION SCIENCE, v.43, no.1, pp.53 - 68, 2001-01 |
The interfaces of Ag-rich and Cu-rich AgCu phases boost oxygen reduction activity Park, Youngtae; Lee, Changsoo; Choi, Jungwoo; Kang, Phil Woong; Scheu, Christina; Lee, Hyuck Mo; Choi, Pyuck-Pa; et al, APPLIED SURFACE SCIENCE, v.637, 2023-11 |
THE INTERFACIAL LAYER FORMATION OF THE AL2O3/SI STRUCTURES GROWN BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION KIM, TW; KANG, WN; YOON, YS; YOM, SS; Lee, JeongYong; KIM, CY; LIM, H; et al, JOURNAL OF APPLIED PHYSICS, v.74, no.1, pp.760 - 762, 1993-07 |
The Li intercalation potential of LiMPO4 and LiMSiO4 olivines with M = Fe, Mn, Co, Ni Zhou F; Cococcioni M; Kang K; Ceder G, ELECTROCHEMISTRY COMMUNICATIONS, v.6, no.11, pp.1144 - 1148, 2004-11 |
The link between crack velocity and rupture time in creeping solids Yu, Jin, ENGINEERING FRACTURE MECHANICS, v.53, no.2, pp.213 - 230, 1996 |
THE LINK BETWEEN CREEP-RUPTURE AND CREEP CRACK-GROWTH FOR A POWER-LAW CREEPING MATERIAL - A MONKMAN-GRANT ANALOG Yu, Jin; JEON, JY, SCRIPTA METALLURGICA ET MATERIALIA, v.31, no.5, pp.565 - 569, 1994-09 |
The low temperature processing for removal of metallic bismuth in ferroelectric SrBi2Ta2O9 thin films Kim, Ho Gi, APPLIED SURFACE SCIENCE, v.140, no.1-2, pp.150 - 155, 1999-01 |
The magnetic properties and morphology of CoCrPtTa/Cr/AlN thin films Chang, HS; Shin, KH; Lee, TD; Park, Joong Keun, JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.177, no.181, pp.913 - 914, 1998-01 |
The Maximum Separation Cluster Analysis Algorithm for Atom-Probe Tomography: Parameter Determination and Accuracy Jaegle, Eric Aime; Choi, Pyuck-Pa; Raabe, Dierk, MICROSCOPY AND MICROANALYSIS, v.20, no.6, pp.1662 - 1671, 2014-12 |
The measurement of electro-optic coefficient of PZT thin films dried at different temperatures using two-beams polarization interferometer Lee, CH; Spirin, V; Koo, JM; Kim, DW; No, Kwangsoo, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.32, pp.442 - 2, 1998-02 |
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