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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Effect of thermal annealing on the formation and the microstructural properties of the interfacial layer between ZnO thin films and n-Si (001) substrates Yuk, Jong Min; Lee, Jeong Yong, The 13th International Symposium on the Physics of Semiconductors and Applications, International Symposium on the Physics of Semiconductors and Applications(ISPSA), 2006-08-22 | |
| Defect formation mechanisms in the interfacial layer due to thermal treatment between the ZnO thin film and the Si substrate Yuk, Jong Min; Lee, Jeong Yong, Asian-Pacific Conference on Surface Science, Asian-Pacific Conference, 2006-12-19 |
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