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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Stability and read/write characteristics of nano ferroelectric domains No, Kwangsoo; Song, HW; Hong, J; Woo, J; Shin, H; Hong, S, 3rd Asian Meeting on Ferroelectrics, AMF-3, v.259, no.1, pp.289 - 298, 2002-12-13 | |
| Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in atomic force microscope based memory device No, Kwangsoo; Woo, J; Hong, S, IEEE international symposium on the applications of ferroelectrics (ISAF 2000), 2000-01-01 | |
| Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy Woo, J; Hong, S; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsoo, 13th International Vaccum Microelectronics Conference, v.19, no.3, pp.818 - 824, 2000-08-14 | |
| Data Storage Systems Based on Atomic Force Microscopy No, Kwangsoo; Shin, H; Hong, S; Woo, J; Jeon, JU; Pak, YE, The joint symposium of the Asian Symposium on Organized Molecular Films for Electronics and Photonics and the 11th Molecular Electronics and Devices Symposium, pp.O-4 -, 2000-07-10 | |
| Lead titanate thin films obtained from the reaction of a TiO2 precursor layer with PbO for the application as ferroelectric media in high density prob No, Kwangsoo; Buhlmann, S; Nam, YW; Hong, S; Kim, Y, 2006 MRS spring meeting, pp.17 - 21, MRS, 2006-04-19 | |
| Resistive Probe Storage: R/W Mechanism No, Kwangsoo; Hong, S; Ko, H; Min, DK; Jung, JH; Park, H; Park, C, International Probe Storage Workshop III, v.0, no.0, pp.0 - 0, IBM Zurich Research Laboratory, 2005-03-01 | |
| Surface potential relaxation of ferroelectric domain investigated by kelvin probe force microscopy Kim, J; Kim, Y; No, Kwangsoo; Bhlmann, S; Hong, S; Nam, YW; Kim, SH, 18th International Symposium on Integrated Ferroelectrics (ISIF 2006), pp.25 - 30, 2006-04-23 |
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