DSpace at KOASAS: Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy

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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Conference Papers(학술회의논문)

Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy

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Woo, J / Hong, S / Setter, N / Shin, H / Jeon, JU / Pak, YE / No, Kwangsoo researcher

Issue Date: 2000-08-14

Language: ENG

Citation: 13th International Vaccum Microelectronics Conference, v.19, no.3, pp.818 - 824

ISSN: 1071-1023

URI: http://hdl.handle.net/10203/126127

Appears in Collection: MS-Conference Papers(학술회의논문)

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Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy

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