Search
Results 1-3 of 3 (Search time: 0.005 seconds).
| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Effect of thermal annealing on the formation and the microstructural properties of the interfacial layer between ZnO thin films and n-Si (001) substrates Yuk, Jong Min; Lee, Jeong Yong, The 13th International Symposium on the Physics of Semiconductors and Applications, International Symposium on the Physics of Semiconductors and Applications(ISPSA), 2006-08-22 | |
| Defect formation mechanisms in the interfacial layer due to thermal treatment between the ZnO thin film and the Si substrate Yuk, Jong Min; Lee, Jeong Yong, Asian-Pacific Conference on Surface Science, Asian-Pacific Conference, 2006-12-19 | |
| In-Situ TEM Observation of Metal Zn Nanocrystal Growth on ZnO Films Yuk, Jong Min; Kim, Kwanpyo; Lee, Zonghoon; Watanabe, Masashi; Zettl, Alex; Lee, Jeong Yong; No, Young Soo; Kim, Tae Whan; Choi, Won Kook, Microscopy & Microanalysis 2009 Meeting, Microscopy & Microanalysis, 2009-07-26 |
Discover